Combined Contactless Conductometric, Photometric, and Fluorimetric Single Point Detector for Capillary Separation Methods

2010 ◽  
Vol 82 (1) ◽  
pp. 129-135 ◽  
Author(s):  
Markéta Ryvolová ◽  
Jan Preisler ◽  
František Foret ◽  
Peter C. Hauser ◽  
Pavel Krásenský ◽  
...  
2002 ◽  
Vol 35 (2) ◽  
pp. 253-260 ◽  
Author(s):  
Katrin Pilz ◽  
Michael Estermann ◽  
Sander van Smaalen

An autoindexing procedure is described that produces the indexing of diffraction data of aperiodic crystals. The procedure has been designed for indexing the data obtained with an area detector, but it can also be applied to data obtained with a single-point detector. The essential step in the indexing process is the ability to discriminate between reflections that fit to a reciprocal lattice, the satellite reflections and possible reflections that do not belong to this indexing. To achieve this goal, the refinement of the orientation matrix and the diffractometer parameters is made an intrinsic part of the process of indexing. The proposed autoindexing procedure has been implemented in a computer program calledBAYINDEX. Successful application to data sets of three different one-dimensionally modulated structures, one two-dimensionally modulated structure and a periodic crystal is presented. Very good agreement between experimental and theoretical reflection positions is found. The indexing produced byBAYINDEXcan serve as the basis for integration routines.


2010 ◽  
Vol 43 (2) ◽  
pp. 264-268 ◽  
Author(s):  
Keith Rogers ◽  
Paul Evans ◽  
Joseph Rogers ◽  
JerWang Chan ◽  
Anthony Dicken

This paper presents the first use of a simple novel geometry that enables the measurement of diffractograms from polycrystalline materials through linear translation of a point detector. The geometry is such that intensities from all points around any Debye ring are summed to a single point, and thus coherently scattered X-rays are harvested efficiently. Data from initial experimental verification of the approach used in transmission mode are presented and the diffractograms compared with their equivalent measured using a pencil beam. Brief discussions of potential modifications in reflection geometry and applications for fibre samples are also provided.


1995 ◽  
Vol 387 ◽  
Author(s):  
H. Xu ◽  
J. C. Sturm

AbstractThe directional reflectance and approximate emissivity of rough silicon wafers were measured by reflection measurements using a single point detector and a broad area illumination source. Experiments were also performed to determine the cone angle of the incident light required to properly measure the emissivity of rough backsides. Based on surface roughness parameters acquired with an Atomic Force Microscope, reflectance calculations were performed within the framework of the Beckmann-Spizzichino model. The results are qualitatively consistent with experimental observations.


2016 ◽  
Vol 365 ◽  
pp. 173-179 ◽  
Author(s):  
Xue-Feng Liu ◽  
Wen-Kai Yu ◽  
Xu-Ri Yao ◽  
Bin Dai ◽  
Long-Zhen Li ◽  
...  

2018 ◽  
Vol 43 (19) ◽  
pp. 4607 ◽  
Author(s):  
Shikang Li ◽  
Peng Zhao ◽  
Xue Feng ◽  
Kaiyu Cui ◽  
Fang Liu ◽  
...  

Electronics ◽  
2019 ◽  
Vol 8 (5) ◽  
pp. 536 ◽  
Author(s):  
Hongping Gan ◽  
Song Xiao ◽  
Tao Zhang ◽  
Zhimin Zhang ◽  
Jie Li ◽  
...  

Single-pixel imaging (SPI) is an emerging framework that can capture the image of a scene via a single-point detector at a considerably low cost. It measures the projection at the detector of the scene under view with certain patterns. One can reconstruct the image of the scene via post-processing the measurements modulated by the patterns. However, the most commonly-used random patterns are not always desirable in many applications, especially for real-time, resource-limited occasions, due to their high memory requirement and huge cost in software and hardware implementation. In this paper, a chaotic pattern array is proposed for the SPI architecture. Compared with random patterns, the proposed chaotic pattern array can not only promise to increase the capabilities of the SPI device, but can also reduce the memory cost and complexity of hardware implementation in the meantime. Moreover, convincing experiment results are given to illustrate that the proposed pattern array is suitable for single-pixel cameras, as well as other compressive imaging applications.


1995 ◽  
Vol 389 ◽  
Author(s):  
H. Xu ◽  
J.C. Sturm

ABSTRACTThe directional reflectance and approximate emissivity of rough silicon wafers were measured by reflection measurements using a single point detector and a broad area illumination source. Experiments were also performed to determine the cone angle of the incident light required to properly measure the emissivity of rough backsides. Based on surface roughness parameters acquired with an Atomic Force Microscope, reflectance calculations were performed within the framework of the Beckmann-Spizzichino model. The results are qualitatively consistent with experimental observations.


Author(s):  
P.M. Houpt ◽  
A. Draaijer

In confocal microscopy, the object is scanned by the coinciding focal points (confocal) of a point light source and a point detector both focused on a certain plane in the object. Only light coming from the focal point is detected and, even more important, out-of-focus light is rejected.This makes it possible to slice up optically the ‘volume of interest’ in the object by moving it axially while scanning the focused point light source (X-Y) laterally. The successive confocal sections can be stored in a computer and used to reconstruct the object in a 3D image display.The instrument described is able to scan the object laterally with an Ar ion laser (488 nm) at video rates. The image of one confocal section of an object can be displayed within 40 milliseconds (1000 х 1000 pixels). The time to record the total information within the ‘volume of interest’ normally depends on the number of slices needed to cover it, but rarely exceeds a few seconds.


2020 ◽  
Vol 655 ◽  
pp. 185-198
Author(s):  
J Weil ◽  
WDP Duguid ◽  
F Juanes

Variation in the energy content of prey can drive the diet choice, growth and ultimate survival of consumers. In Pacific salmon species, obtaining sufficient energy for rapid growth during early marine residence is hypothesized to reduce the risk of size-selective mortality. In order to determine the energetic benefit of feeding choices for individuals, accurate estimates of energy density (ED) across prey groups are required. Frequently, a single species is assumed to be representative of a larger taxonomic group or related species. Further, single-point estimates are often assumed to be representative of a group across seasons, despite temporal variability. To test the validity of these practices, we sampled zooplankton prey of juvenile Chinook salmon to investigate fine-scale taxonomic and temporal differences in ED. Using a recently developed model to estimate the ED of organisms using percent ash-free dry weight, we compared energy content of several groups that are typically grouped together in growth studies. Decapod megalopae were more energy rich than zoeae and showed family-level variability in ED. Amphipods showed significant species-level variability in ED. Temporal differences were observed, but patterns were not consistent among groups. Bioenergetic model simulations showed that growth rate of juvenile Chinook salmon was almost identical when prey ED values were calculated on a fine scale or on a taxon-averaged coarse scale. However, single-species representative calculations of prey ED yielded highly variable output in growth depending on the representative species used. These results suggest that the latter approach may yield significantly biased results.


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