Metal Salts for Molecular Ion Yield Enhancement in Organic Secondary Ion Mass Spectrometry:  A Critical Assessment

A. Delcorte; P. Bertrand

doi:10.1021/ac040158s

Metal Salts for Molecular Ion Yield Enhancement in Organic Secondary Ion Mass Spectrometry: A Critical Assessment

Analytical Chemistry ◽

10.1021/ac040158s ◽

2005 ◽

Vol 77 (7) ◽

pp. 2107-2115 ◽

Cited By ~ 22

Author(s):

A. Delcorte ◽

P. Bertrand

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Critical Assessment ◽

Metal Salts ◽

Yield Enhancement ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters

Surface and Interface Analysis ◽

10.1002/sia.3161 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 498-501 ◽

Cited By ~ 9

Author(s):

Guangtao Li ◽

Jobin Cyriac ◽

Liang Gao ◽

R. Graham Cooks

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Water Clusters ◽

Yield Enhancement ◽

Soft Landing ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.068 ◽

2008 ◽

Vol 255 (4) ◽

pp. 824-827 ◽

Cited By ~ 5

Author(s):

Nimer Wehbe ◽

Arnaud Delcorte ◽

Andreas Heile ◽

Heinrich F. Arlinghaus ◽

Patrick Bertrand

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Yield Enhancement ◽

Gold Deposition ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power

Journal of the American Society for Mass Spectrometry ◽

10.1021/jasms.0c00080 ◽

2020 ◽

Vol 31 (7) ◽

pp. 1518-1524

Author(s):

Marko Brajković ◽

Marko Barac ◽

Iva Bogdanović Radović ◽

Zdravko Siketić

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Stopping Power ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary ion mass spectrometry: Polyatomic and molecular ion emission

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(86)90513-6 ◽

1986 ◽

Vol 13 (1-3) ◽

pp. 259-277 ◽

Cited By ~ 11

Author(s):

Richard J. Colton ◽

Mark M. Ross ◽

David A. Kidwell

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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Biosynthetic Product Molecular Weight Determinations by Solution Phase Secondary Ion Mass Spectrometry Employing Group 1A Metal Salts

Journal of Natural Products ◽

10.1021/np50040a001 ◽

1985 ◽

Vol 48 (4) ◽

pp. 513-522 ◽

Cited By ~ 3

Author(s):

Cedric W. Holzapfel ◽

George R. Pettit ◽

Gordon M. Cragg

Keyword(s):

Mass Spectrometry ◽

Molecular Weight ◽

Secondary Ion Mass Spectrometry ◽

Solution Phase ◽

Metal Salts ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary ion mass spectrometry of MCsn+ molecular ion complexes

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2006.12.172 ◽

2007 ◽

Vol 258 (1) ◽

pp. 218-225 ◽

Cited By ~ 16

Author(s):

Biswajit Saha ◽

Purushottam Chakraborty

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.1881 ◽

2005 ◽

Vol 19 (8) ◽

pp. 1017-1024 ◽

Cited By ~ 25

Author(s):

L. Adriaensen ◽

F. Vangaever ◽

J. Lenaerts ◽

R. Gijbels

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Organic Films ◽

Molecular Ion ◽

Thin Organic Films ◽

Ion Mass Spectrometry ◽

Ion Yields ◽

Secondary Ion

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Evidence for radical anion formation during liquid secondary ion mass spectrometry analysis of oligonucleotides and synthetic oligomeric analogs: a deconvolution algorithm for molecular ion region clusters

Analytical Chemistry ◽

10.1021/ac00194a008 ◽

1989 ◽

Vol 61 (19) ◽

pp. 2154-2160 ◽

Cited By ~ 24

Author(s):

J. A. Laramee ◽

B. Arbogast ◽

M. L. Deinzer

Keyword(s):

Mass Spectrometry ◽

Radical Anion ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Analysis ◽

Anion Formation ◽

Molecular Ion ◽

Spectrometry Analysis ◽

Deconvolution Algorithm ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection

Surface and Interface Analysis ◽

10.1002/sia.5043 ◽

2012 ◽

Vol 45 (1) ◽

pp. 46-49 ◽

Cited By ~ 6

Author(s):

T. Mouhib ◽

A. Delcorte ◽

C. Poleunis ◽

P. Bertrand

Keyword(s):

Mass Spectrometry ◽

Water Vapour ◽

Secondary Ion Mass Spectrometry ◽

Yield Enhancement ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary-Ion-Mass-Spectrometry Depth Profiling of Ultra-shallow Boron Delta Layers in Silicon with Massive Molecular Ion Beam of Ir4(CO)7+

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.7599 ◽

2007 ◽

Vol 46 (11) ◽

pp. 7599-7601 ◽

Cited By ~ 8

Author(s):

Yukio Fujiwara ◽

Kouji Kondou ◽

Kouji Watanabe ◽

Hidehiko Nonaka ◽

Naoaki Saito ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Depth Profiling ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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