Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters

2010 ◽  
Vol 43 (1-2) ◽  
pp. 498-501 ◽  
Author(s):  
Guangtao Li ◽  
Jobin Cyriac ◽  
Liang Gao ◽  
R. Graham Cooks
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Water Clusters ◽  
Yield Enhancement ◽  
Soft Landing ◽  
Molecular Ion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry

2008 ◽  
Vol 255 (4) ◽  
pp. 824-827 ◽  
Author(s):  
Nimer Wehbe ◽  
Arnaud Delcorte ◽  
Andreas Heile ◽  
Heinrich F. Arlinghaus ◽  
Patrick Bertrand
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Yield Enhancement ◽  
Gold Deposition ◽  
Molecular Ion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Secondary-Ion-Mass-Spectrometry Depth Profiling of Ultra-shallow Boron Delta Layers in Silicon with Massive Molecular Ion Beam of Ir4(CO)7+

2007 ◽  
Vol 46 (11) ◽  
pp. 7599-7601 ◽  
Author(s):  
Yukio Fujiwara ◽  
Kouji Kondou ◽  
Kouji Watanabe ◽  
Hidehiko Nonaka ◽  
Naoaki Saito ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Depth Profiling ◽  
Molecular Ion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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