Depth profile of silver in a matrix of silicon dioxide by Rutherford backscattering spectrometry

John A. Leavitt; David K. Rollins; Quintus. Fernando

doi:10.1021/ac00292a022

Depth profile of silver in a matrix of silicon dioxide by Rutherford backscattering spectrometry

Analytical Chemistry ◽

10.1021/ac00292a022 ◽

1986 ◽

Vol 58 (1) ◽

pp. 90-93 ◽

Cited By ~ 1

Author(s):

John A. Leavitt ◽

David K. Rollins ◽

Quintus. Fernando

Keyword(s):

Silicon Dioxide ◽

Depth Profile ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering

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High-resolution Rutherford backscattering spectrometry study on process dependent elemental depth profile change of hafnium silicate on silicon

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.3125263 ◽

2009 ◽

Vol 27 (4) ◽

pp. 937-942 ◽

Cited By ~ 1

Author(s):

C. Ichihara ◽

S. Yasuno ◽

H. Takeuchi ◽

A. Kobayashi ◽

S. Mure ◽

...

Keyword(s):

High Resolution ◽

Depth Profile ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Hafnium Silicate ◽

Elemental Depth ◽

Profile Change ◽

Elemental Depth Profile

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A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films

Thin Solid Films ◽

10.1016/0040-6090(88)90269-6 ◽

1988 ◽

Vol 161 ◽

pp. L69-L70 ◽

Cited By ~ 1

Author(s):

H. De Rugy ◽

J.P. Langeron ◽

S. Bouquet ◽

L. Minel ◽

G.I. Grigonov ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Depth Profile ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Auger Electron Spectroscopy Depth ◽

Profile Study

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7371. Depth profile analysis of two element mixtures by Rutherford backscattering spectrometry

Vacuum ◽

10.1016/0042-207x(91)91178-q ◽

1991 ◽

Vol 42 (8-9) ◽

pp. 591

Keyword(s):

Depth Profile ◽

Rutherford Backscattering Spectrometry ◽

Profile Analysis ◽

Rutherford Backscattering ◽

Depth Profile Analysis

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Depth profile analysis of two element mixtures by rutherford backscattering spectrometry

Radiation Effects and Defects in Solids ◽

10.1080/10420159008213088 ◽

1990 ◽

Vol 114 (1-2) ◽

pp. 115-131 ◽

Cited By ~ 3

Author(s):

Qi-Chu Zhang ◽

P. McMillan ◽

J. C. Kelly

Keyword(s):

Depth Profile ◽

Rutherford Backscattering Spectrometry ◽

Profile Analysis ◽

Rutherford Backscattering ◽

Depth Profile Analysis

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Stoichiometric Determination of Graphite Intercalation Compounds Using Rutherford Backscatiering Spectrometry

MRS Proceedings ◽

10.1557/proc-27-481 ◽

1983 ◽

Vol 27 ◽

Author(s):

L. Salamanca-Riba ◽

B.S. Elman ◽

M.S. Dresselhaus ◽

T. Venkatesan

Keyword(s):

Experimental Error ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Intercalation Compounds ◽

Graphite Intercalation Compounds ◽

X Ray ◽

Donor And Acceptor ◽

Graphite Intercalation ◽

Non Destructive

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

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