Fourier transform infrared reflection absorption spectrometry and electron spectroscopy for chemical analysis for surface analysis

1982 ◽  
Vol 54 (4) ◽  
pp. 682-687 ◽  
Author(s):  
Akira. Ishitani ◽  
Hideyuki. Ishida ◽  
Fusami. Soeda ◽  
Yoshikatsu. Nagasawa
2008 ◽  
Vol 62 (2) ◽  
pp. 171-175 ◽  
Author(s):  
M. Schmidt ◽  
J. S. Lee ◽  
M. Grunze ◽  
K. H. Kim ◽  
U. Schade

1978 ◽  
Vol 57 (4) ◽  
pp. 551-556 ◽  
Author(s):  
R.L. Bowen

Surface analysis by XPS (X-ray photoelectron spectroscopy), also called ESCA (electron spectroscopy for chemical analysis), indicates that only certain cations are appreciably sorbed by enamel from an acid etching solution containing phosphoric acid and equimolar concentrations of candidate mordant salts.


Langmuir ◽  
1993 ◽  
Vol 9 (9) ◽  
pp. 2370-2382 ◽  
Author(s):  
J. A. Mielczarski ◽  
J. M. Cases ◽  
E. Bouquet ◽  
O. Barres ◽  
J. F. Delon

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