Fourier-transform infrared and electron spectroscopy for chemical analysis studies of block copolymers of styrene and dimethylsiloxane

1992 ◽  
Vol 25 (24) ◽  
pp. 6621-6630 ◽  
Author(s):  
Xin Chen ◽  
Joseph A. Gardella ◽  
Philip L. Kumler
2009 ◽  
Vol 29 (2) ◽  
pp. 134-138 ◽  
Author(s):  
Toshiko INOUE ◽  
Masato YAMAMOTO ◽  
Kazuhiro DEBARI ◽  
Keitatsu KOU ◽  
Makoto SAITO ◽  
...  

1996 ◽  
Vol 29 (5) ◽  
pp. 1660-1665 ◽  
Author(s):  
Hengzhong Zhuang ◽  
Kacey Gribbin Marra ◽  
Tai Ho ◽  
Toby M. Chapman ◽  
Joseph A. Gardella

Author(s):  
Robert K. Lowry ◽  
Kristen L. Hanley

Abstract Most semiconductor devices are sealed in plastic. Virtually all plastic encapsulated microcircuits (PEMs) look alike. The particular electronic molding compound (EMC) used to encapsulate a device cannot be known except from production records or firsthand knowledge of people familiar with the device. For a variety of reasons, an EMC may need to be explicitly identified. Pyrolysis of the EMC, followed by Fourier Transform Infrared (FT-IR) chemical analysis of the condensates of organic substances evolved by the pyrolysis, and comparison of the spectra with a reference library of known EMCs, provides a rapid means of specific EMC identification.


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