Electrical properties of CdTe/CdS solar cells investigated with conductive atomic force microscopy

2006 ◽  
Vol 514 (1-2) ◽  
pp. 150-155 ◽  
Author(s):  
H.R. Moutinho ◽  
R.G. Dhere ◽  
C.-S. Jiang ◽  
M.M. Al-Jassim ◽  
L.L. Kazmerski
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electrical Properties ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Emerging Conductive Atomic Force Microscopy for Metal Halide Perovskite Materials and Solar Cells

2020 ◽  
Vol 10 (10) ◽  
pp. 1903922 ◽  
Author(s):  
Haonan Si ◽  
Suicai Zhang ◽  
Shuangfei Ma ◽  
Zhaozhao Xiong ◽  
Ammarah Kausar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Metal Halide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Perovskite Materials ◽  
Metal Halide Perovskite ◽  
Halide Perovskite

Electrochemical and atomic force microscopy investigations of the effect of CdS on the local electrical properties of CH3NH3PbI3:CdS perovskite solar cells

2017 ◽  
Vol 5 (46) ◽  
pp. 12112-12120 ◽  
Author(s):  
Mingxuan Guo ◽  
Fumin Li ◽  
Lanyu Ling ◽  
Chong Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electrochemical Impedance Spectroscopy ◽  
Electrochemical Impedance ◽  
Bulk Heterojunction ◽  
Perovskite Solar Cells ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

The effect of the incorporated CdS on the local optoelectronic properties of CH3NH3PbI3:CdS bulk heterojunction (BHJ) perovskite solar cells (PSCs) are studied using Kelvin probe force microscopy (KPFM), conductive atomic force microscopy (c-AFM) and electrochemical impedance spectroscopy (EIS).

Towards a unified description of the charge transport mechanisms in conductive atomic force microscopy studies of semiconducting polymers

Nanoscale ◽  
2014 ◽  
Vol 6 (18) ◽  
pp. 10596-10603 ◽  
Author(s):  
D. Moerman ◽  
N. Sebaihi ◽  
S. E. Kaviyil ◽  
P. Leclère ◽  
R. Lazzaroni ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Carrier Mobility ◽  
Semiconducting Polymers ◽  
Transport Mechanisms ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Current ◽  
Unified Description

The nanoscale electrical properties of fibrillate poly-3-hexylthiophene are studied using conducting-AFM. The conditions for the prevalence of either local or bulk resistances dominated regime are identified. As local current is space charge limited, an analytical model is derived to determine locally carrier mobility and density.

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