Investigation of nano-scale scratch and stick-slip behaviors of polycarbonate using atomic force microscopy

Tribology International ◽

10.1016/j.triboint.2018.04.024 ◽

2018 ◽

Vol 125 ◽

pp. 59-65 ◽

Cited By ~ 6

Author(s):

Jie Liu ◽

Han Jiang ◽

Qian Cheng ◽

Chaoming Wang

Keyword(s):

Atomic Force Microscopy ◽

Stick Slip ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Solid Surface Tension

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Nano-Scale Observations of Tattoo Pigments in Skin by Atomic Force Microscopy

Tattooed Skin and Health - Current Problems in Dermatology ◽

10.1159/000369187 ◽

2015 ◽

pp. 97-102

Author(s):

Colin A. Grant ◽

Peter C. Twigg ◽

Desmond J. Tobin

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

Ultramicroscopy ◽

10.1016/s0304-3991(03)00032-9 ◽

2003 ◽

Vol 97 (1-4) ◽

pp. 81-87 ◽

Cited By ~ 22

Author(s):

Tomoyuki Yoshino ◽

Shigeru Sugiyama ◽

Shoji Hagiwara ◽

Daisuke Fukushi ◽

Motoharu Shichiri ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Near Field ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Nano scale defects in langmuir-blodgett film observed by atomic force microscopy

Synthetic Metals ◽

10.1016/0379-6779(93)90515-x ◽

1993 ◽

Vol 57 (1) ◽

pp. 3795-3800 ◽

Cited By ~ 5

Author(s):

J. Garnaes ◽

D.K. Schwartz ◽

R. Viswanathan ◽

J.A.N. Zasadzinski

Keyword(s):

Atomic Force Microscopy ◽

Blodgett Film ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Nano Scale ◽

Atomic Force ◽

Langmuir Blodgett Film

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Wear characterisation of articular cartilage surfaces at a nano-scale using atomic force microscopy

Tribology International ◽

10.1016/j.triboint.2012.11.001 ◽

2013 ◽

Vol 63 ◽

pp. 235-242 ◽

Cited By ~ 9

Author(s):

M. Wang ◽

Z. Peng ◽

J. Wang ◽

X. Jiang

Keyword(s):

Atomic Force Microscopy ◽

Articular Cartilage ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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A quantitative analysis of surface deformation by stick/slip atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.366541 ◽

1997 ◽

Vol 82 (8) ◽

pp. 3763-3770 ◽

Cited By ~ 7

Author(s):

J. Kerssemakers ◽

J. Th. M. De Hosson

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Surface Deformation ◽

Stick Slip ◽

Force Microscopy ◽

Atomic Force

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Line Scan Reconstruction: A Viable Approach for Tracking Atomic Stick–Slip Events and True Tip Position in Atomic Force Microscopy

Tribology Letters ◽

10.1007/s11249-016-0761-0 ◽

2016 ◽

Vol 64 (2) ◽

Cited By ~ 1

Author(s):

Quanzhou Yao ◽

Qunyang Li

Keyword(s):

Atomic Force Microscopy ◽

Stick Slip ◽

Force Microscopy ◽

Line Scan ◽

Atomic Force ◽

Tip Position ◽

Viable Approach

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Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/35/16/324 ◽

2002 ◽

Vol 35 (16) ◽

pp. 2066-2074 ◽

Cited By ~ 10

Author(s):

Gregory S Watson ◽

Bradley P Dinte ◽

Jolanta A Blach ◽

Sverre Myhra

Keyword(s):

Atomic Force Microscopy ◽

Atomic Scale ◽

Stick Slip ◽

Force Microscopy ◽

Atomic Force

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Nano-Scale Simulative Measuring Model for Tapping Mode Atomic Force Microscopy and Analysis for Measuring a Nano-Scale Ladder-Shape Standard Sample

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2010.2375 ◽

2010 ◽

Vol 10 (7) ◽

pp. 4400-4410

Author(s):

Zone-Ching Lin ◽

Ming-Ho Chou

Keyword(s):

Atomic Force Microscopy ◽

Standard Sample ◽

Tapping Mode ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Measurement of the roughness of nano-scale surfaces, both unannealed and with limited anneal, by atomic force microscopy

Measurement Science and Technology ◽

10.1088/0957-0233/25/10/105001 ◽

2014 ◽

Vol 25 (10) ◽

pp. 105001 ◽

Cited By ~ 2

Author(s):

M P Seah

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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