Initial oxidation of HF-acid treated Si(100) surfaces under air exposure studied by synchrotron radiation X-ray photoelectron spectroscopy

2007 ◽  
Vol 601 (11) ◽  
pp. 2302-2306 ◽  
Author(s):  
F. Hirose ◽  
M. Nagato ◽  
Y. Kinoshita ◽  
S. Nagase ◽  
Y. Narita ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Initial Oxidation ◽  
Air Exposure ◽  
X Ray

X-Ray Photoelectron Spectroscopy Estimation of Cobalt Seed Layer Reactivity Toward Air Exposure: A Challenge?

2020 ◽  
Vol 97 (1) ◽  
pp. 149-156
Author(s):  
Arnaud Etcheberry ◽  
Amine Lakhdari ◽  
Louis Caillard ◽  
Dominique Suhr ◽  
Mikailou Thiam ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Seed Layer ◽  
Air Exposure ◽  
X Ray

EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

2002 ◽  
Vol 09 (02) ◽  
pp. 937-941 ◽  
Author(s):  
P. LUCHES ◽  
C. GIOVANARDI ◽  
T. MOIA ◽  
S. VALERI ◽  
F. BRUNO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Lattice Constant ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Direction Parallel ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rocksalt Structure ◽  
Plane Lattice

CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

2015 ◽  
Vol 119 (23) ◽  
pp. 12910-12915 ◽  
Author(s):  
Chi-Yuan Lin ◽  
Cheng-En Cheng ◽  
Shuai Wang ◽  
Hung Wei Shiu ◽  
Lo Yueh Chang ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Time Resolved ◽  
X Ray

The initial oxidation of poly-crystalline aluminum studied with x-ray photoelectron spectroscopy

2014 ◽  
Vol 47 (10) ◽  
pp. 105301
Author(s):  
Jiang-Tao Li ◽  
Bart Hoekstra ◽  
Zhen-Bin Wang ◽  
Yi-Kang Pu
Keyword(s):  
Photoelectron Spectroscopy ◽  
Initial Oxidation ◽  
X Ray
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