Band Alignment of Al2 O3 Layer Deposited NO and SO2 Exposed (001) H-Diamond Heterointerfaces Studied by Synchrotron Radiation X-Ray Photoelectron Spectroscopy

2018 ◽  
Vol 215 (22) ◽  
pp. 1800237 ◽  
Author(s):  
Niloy C. Saha ◽  
Kazutoshi Takahashi ◽  
Masaki Imamura ◽  
Makoto Kasu
Keyword(s):  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Band Alignment ◽  
X Ray

Band alignment in Ge/GeOx/HfO2/TiO2 heterojunctions as measured by hard x-ray photoelectron spectroscopy

2012 ◽  
Vol 101 (22) ◽  
pp. 222110 ◽  
Author(s):  
A. K. Rumaiz ◽  
J. C. Woicik ◽  
C. Weiland ◽  
Q. Xie ◽  
D. P. Siddons ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Band Alignment ◽  
X Ray

Band alignment of HfO2/Al0.25Ga0.75N determined by x-ray photoelectron spectroscopy: Effect of SiH4 surface treatment

2014 ◽  
Vol 104 (9) ◽  
pp. 091605 ◽  
Author(s):  
Man Hon Samuel Owen ◽  
Maruf Amin Bhuiyan ◽  
Qian Zhou ◽  
Zheng Zhang ◽  
Ji Sheng Pan ◽  
...  
Keyword(s):  
Surface Treatment ◽  
Photoelectron Spectroscopy ◽  
Band Alignment ◽  
X Ray

EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

2002 ◽  
Vol 09 (02) ◽  
pp. 937-941 ◽  
Author(s):  
P. LUCHES ◽  
C. GIOVANARDI ◽  
T. MOIA ◽  
S. VALERI ◽  
F. BRUNO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Lattice Constant ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Direction Parallel ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rocksalt Structure ◽  
Plane Lattice

CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

Interfacial electronic band alignment of Ta2O5/hydrogen-terminated diamond heterojunction determined by X-ray photoelectron spectroscopy

2013 ◽  
Vol 38 ◽  
pp. 24-27 ◽  
Author(s):  
Jiangwei Liu ◽  
Shaoheng Cheng ◽  
Meiyong Liao ◽  
Masataka Imura ◽  
Akihiro Tanaka ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Band Alignment ◽  
Electronic Band ◽  
X Ray

Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

2015 ◽  
Vol 119 (23) ◽  
pp. 12910-12915 ◽  
Author(s):  
Chi-Yuan Lin ◽  
Cheng-En Cheng ◽  
Shuai Wang ◽  
Hung Wei Shiu ◽  
Lo Yueh Chang ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Time Resolved ◽  
X Ray
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