A semiempirical surface scattering model for quantum corrected full-band Monte-Carlo simulation of biaxially strained Si/SiGe NMOSFETs
2006 ◽
Vol 50
(4)
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pp. 694-700
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2006 ◽
Vol 135
(3)
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pp. 224-227
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Keyword(s):
Keyword(s):
2005 ◽
Vol 52
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pp. 153-171
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Keyword(s):
Keyword(s):
2005 ◽
Vol 36
(1)
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pp. 61-65
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2000 ◽
Vol 47
(3)
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pp. 493-497
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