A semiempirical surface scattering model for quantum corrected Monte-Carlo simulation of unstrained Si and strained Si/SiGe PMOSFETs
2006 ◽
Vol 135
(3)
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pp. 224-227
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2006 ◽
Vol 50
(4)
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pp. 694-700
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2005 ◽
Vol 52
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pp. 153-171
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2008 ◽
Vol 124
(4)
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pp. 2585-2585
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2005 ◽
Vol 19
(8)
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pp. 1085-1102
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