A corrosion couple experiment reproducing the black pad phenomenon found after the electroless nickel immersion gold process

2010 ◽  
Vol 63 (5) ◽  
pp. 508-511 ◽  
Author(s):  
K.H. Kim ◽  
Jin Yu ◽  
J.H. Kim
Keyword(s):  
Electroless Nickel ◽  
Electroless Nickel Immersion Gold ◽  
Black Pad ◽  
Couple Experiment

Quantitative Bump Height Analysis in ENIG Using Design of Experiment

2014 ◽  
Vol 896 ◽  
pp. 660-663
Author(s):  
Zaliman Sauli ◽  
Vithyacharan Retnasamy ◽  
Phaklen Ehkan ◽  
Fairul Afzal Ahmad Fuad ◽  
Aaron Koay Terr Yeow
Keyword(s):  
Design Of Experiment ◽  
Flip Chip ◽  
Electroless Nickel ◽  
Bump Height ◽  
Process Robustness ◽  
Electroless Nickel Immersion Gold ◽  
Optimization Of Process Parameters ◽  
Chip Technology ◽  
Higher Temperature

Flip chip technology has grown by leaps and bounds and is getting even smaller in size. Optimization of process parameters in manufacturing is eminent due to reliability issues. This paper reports the parameters that affect the quality of the bump height in electroless nickel immersion gold (ENIG) and their relationships between each other. A total of four different combinations of parameters have been carried out for this investigation using the design of experiment (DOE) approach. It can be concluded that higher temperature of electroless nickel permits an increase of bump height where as the increment in immersion gold temperature does not nessasarily affect the value of bump height. All four samples recorded a higher value of bump height than the controlled bump height value. This implies reliability of the solder joint and assembly process robustness can be improved with an increase of bump height by increasing the time.

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