scholarly journals Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

2006 ◽  
Vol 61 (10-11) ◽  
pp. 1129-1134 ◽  
Author(s):  
C. Streli ◽  
G. Pepponi ◽  
P. Wobrauschek ◽  
C. Jokubonis ◽  
G. Falkenberg ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Ray ◽  
Radiation Induced

scholarly journals Synchrotron radiation-induced total reflection X-ray fluorescence analysis

2010 ◽  
Vol 29 (6) ◽  
pp. 479-496 ◽  
Author(s):  
F. Meirer ◽  
A. Singh ◽  
P. Pianetta ◽  
G. Pepponi ◽  
F. Meirer ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Ray ◽  
Radiation Induced

scholarly journals Analysis of individual microscopic particles by means of synchrotron radiation induced x-ray micro fluorescence

1992 ◽  
Vol 50 (2) ◽  
pp. 1766-1767
Author(s):  
K. Janssens ◽  
F. Adams ◽  
M.L. Rivers ◽  
K.W. Jones
Keyword(s):  
Synchrotron Radiation ◽  
Detection Limits ◽  
Fluorescence Analysis ◽  
Individual Particle ◽  
Quantitative Character ◽  
Particle Analysis ◽  
X Ray ◽  
Interesting Approach ◽  
Radiation Induced ◽  
Backscattered Electron

Micro-SXRF (Synchrotron X-ray Fluorescence) or micro-SRIXE (Synchrotron Radiation Induced X-ray Emission) is a microanalytical technique which combines the sensitivity of more conventional microchemical methods such as Secondary Ion Microscopy (SIMS) and μ-PIXE (Proton Induced X-ray Emission) with the non-destructive and quantitative character of X-ray fluorescence analysis. The detection limits attainable at current SXRF-facilities are situated in the ppm (and in favourable cases the sub-ppm) range. The sensitivity of SRIXE can be used advantageously in individual particle analysis. This type of analysis is used, e.g., for studying sources of athmospheric pollution. Analysis of standard NIST micro-spheres at the NSLS-SRIXE facility yielded minimum detection limits in the 1 to 100 ppm range for particle sizes of around 10 to 30 μm.An interesting approach to individual particle characterisation is by means of electron microprobe analysis (EPMA). By using the backscattered electron signals, in an automated fashion, particles can be easily located on a filter substrate and their size and shape determined.

Txrf-Sources-Samples and Detectors

1995 ◽  
Vol 39 ◽  
pp. 755-766
Author(s):  
P. Wobrauschek ◽  
P. Kregsamer ◽  
W. Ladisich ◽  
R. Riede ◽  
Christina Streli ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Detection Limits ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Light Elements ◽  
X Ray

Total reflection x-ray fluorescence analysis (TXRF) has reached a mature state but still improvements are possible in selecting the proper components for TXRF and optimizing them in the best suitable way. Two approaches are presented, the extension of the number of detectable elements after K-shell excitation and the improvement of the detection limits. The results show, that the elements from B to U can be detected by their characteristic K-lines and that detection limits for medium Z elements e.g. Ni in the fg range are achievable. Most of the best results have been measured using synchrotron radiation with spectral modifying devices like multilayer monochromators. Other x-ray sources like a windowless tube with exchangeable anodes of either material Al, Si or Mo were successfully tested for the efficient excitation of light elements.

Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation and special X-ray tubes

1997 ◽  
Vol 52 (7) ◽  
pp. 861-872 ◽  
Author(s):  
Christina Streli ◽  
P Wobrauschek ◽  
V Bauer ◽  
P Kregsamer ◽  
R Görgl ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Light Elements ◽  
X Ray
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