Total reflection x-ray fluorescence analysis with synchrotron radiation and other sources for trace element determination

1997 ◽  
Author(s):  
Peter Wobrauschek ◽  
Christina Streli
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Trace Element Determination ◽  
Element Determination ◽  
X Ray

Trace Element Determination in Diesel Particulates by Total-Reflection X-Ray Fluorescence Analysis

1999 ◽  
Vol 131 (3-4) ◽  
pp. 219-223 ◽  
Author(s):  
Juha K. Vilhunen ◽  
Alex von Bohlen ◽  
Martina Schmeling ◽  
Leena Rantanen ◽  
Seppo Mikkonen ◽  
...  
Keyword(s):  
Trace Element ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Trace Element Determination ◽  
Element Determination ◽  
X Ray

Trace element determination in drugs by total-reflection X-ray fluorescence spectrometry

1997 ◽  
Vol 52 (7) ◽  
pp. 961-965 ◽  
Author(s):  
M. Wagner ◽  
P. Rostam-Khani ◽  
A. Wittershagen ◽  
Claudia Rittmeyer ◽  
B.O. Kolbesen ◽  
...  
Keyword(s):  
Trace Element ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
Trace Element Determination ◽  
Element Determination ◽  
X Ray

Trace element determination in thorium oxide using total reflection X-ray fluorescence spectrometry

2008 ◽  
Vol 63 (1) ◽  
pp. 81-85 ◽  
Author(s):  
N.L. Misra ◽  
Sangita Dhara ◽  
V.C. Adya ◽  
S.V. Godbole ◽  
K.D. Singh Mudher ◽  
...  
Keyword(s):  
Trace Element ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
Trace Element Determination ◽  
Element Determination ◽  
X Ray ◽  
Thorium Oxide

Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination

1985 ◽  
Vol 29 ◽  
pp. 427-434
Author(s):  
Atsuo lida ◽  
Yohichi Gohshi ◽  
Hideki Maezawa
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Trace Element Analysis ◽  
Fluorescence Analysis ◽  
Light Elements ◽  
Element Analysis ◽  
Element Determination ◽  
Undulator Radiation ◽  
Silicon Compounds ◽  
X Ray

AbstractMicro and trace element analysis by X-ray fluorescence was carried out using synchrotron radiation from a bending magnet and an undulator for hard and soft X-ray excitation respectively. The minimum detection limits obtained in the hard X-ray region were less than pg, which corresponds to a spatial resolution of less than a hundred micronmeters, with a detection limit of a few ppm. Light elements such as oxygen, nitrogen and carbon in silicon compounds were analyzed by soft X-ray emission spectroscopy using undulator radiation. The minimum detectable amount of the light elements was greatly improved, since undulator radiation is very strong in intensity, and is highly collimated.

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