A Method of Gate-level Circuit Yield Calculation Based on PTM

Procedia Computer Science ◽

10.1016/j.procs.2017.03.147 ◽

2017 ◽

Vol 107 ◽

pp. 674-684

Author(s):

Jie Xiao ◽

William Lee ◽

Xuhua Yang ◽

Haigen Hu ◽

Yujiao Huang

Keyword(s):

Circuit Yield ◽

Yield Calculation

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Fission yield calculation using toy model based on Monte Carlo simulation

10.1063/1.4930658 ◽

2015 ◽

Author(s):

Jubaidah ◽

Rizal Kurniadi

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Fission Yield ◽

Model Based ◽

Yield Calculation

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Poisson process and integrated circuit yield prediction

Microelectronics Reliability ◽

10.1016/0026-2714(81)90073-1 ◽

1981 ◽

Vol 21 (5) ◽

pp. 751

Keyword(s):

Poisson Process ◽

Integrated Circuit ◽

Yield Prediction ◽

Circuit Yield

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A statistical model for integrated-circuit yield with clustered flaws

IEEE Transactions on Electron Devices ◽

10.1109/16.2490 ◽

1988 ◽

Vol 35 (4) ◽

pp. 524-525 ◽

Cited By ~ 13

Author(s):

J. Shier

Keyword(s):

Statistical Model ◽

Integrated Circuit ◽

Circuit Yield

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Neutron yield calculation of p-Li thick target by using PHITS with JENDL-4.0/HE and ENDF/B-VII for BNCT application

Journal of Nuclear Science and Technology ◽

10.1080/00223131.2021.1996297 ◽

2021 ◽

pp. 1-9

Author(s):

Takeo Nishitani ◽

Yuuki Tanagami ◽

Sachiko Yoshihashi ◽

Kazuki Tsuchida ◽

Atsushi Yamazaki ◽

...

Keyword(s):

Neutron Yield ◽

Thick Target ◽

Yield Calculation

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Neutron yield calculation of thin and thick d-D targets by using PHITS with frag data table

Journal of Nuclear Science and Technology ◽

10.1080/00223131.2021.1981475 ◽

2021 ◽

pp. 1-8

Author(s):

Takeo Nishitani ◽

Sachiko Yoshihashi ◽

Kunihiro Ogawa ◽

Misako Miwa ◽

Shigeo Matsuyama ◽

...

Keyword(s):

Neutron Yield ◽

Data Table ◽

Yield Calculation

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A Survey of Iron Contamination in Silicon Substrates and Its Impact on Circuit Yield

Journal of The Electrochemical Society ◽

10.1149/1.2123612 ◽

1982 ◽

Vol 129 (11) ◽

pp. 2573-2576 ◽

Cited By ~ 23

Author(s):

P. J. Ward

Keyword(s):

Silicon Substrates ◽

Iron Contamination ◽

Circuit Yield

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Circuit yield of organic integrated electronics

2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. ◽

10.1109/isscc.2003.1234346 ◽

2003 ◽

Cited By ~ 10

Author(s):

E. Cantatore ◽

C.M. Hart ◽

M. Digioia ◽

G.H. Gelinck ◽

T.C.T. Geuns ◽

...

Keyword(s):

Integrated Electronics ◽

Circuit Yield

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Integrated circuit yield statistics

Proceedings of the IEEE ◽

10.1109/proc.1983.12619 ◽

1983 ◽

Vol 71 (4) ◽

pp. 453-470 ◽

Cited By ~ 312

Author(s):

C.H. Stapper ◽

F.M. Armstrong ◽

K. Saji

Keyword(s):

Integrated Circuit ◽

Circuit Yield

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Plasma-etching-induced oxide degradation: effects upon device performance and circuit yield

10.1117/12.250821 ◽

1996 ◽

Cited By ~ 1

Author(s):

Scott T. Martin ◽

Guann-pyng Li ◽

Eugene Worley ◽

Joe White

Keyword(s):

Plasma Etching ◽

Device Performance ◽

Oxide Degradation ◽

Circuit Yield

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A review of fault-tolerant techniques for the enhancement of integrated circuit yield

Microelectronics Reliability ◽

10.1016/0026-2714(87)90512-9 ◽

1987 ◽

Vol 27 (3) ◽

pp. 585

Keyword(s):

Integrated Circuit ◽

Fault Tolerant ◽

Circuit Yield

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