scholarly journals iPeM – Integrated Product Engineering Model in Context of Product Generation Engineering

Procedia CIRP ◽  
2016 ◽  
Vol 50 ◽  
pp. 100-105 ◽  
Author(s):  
Albert Albers ◽  
Nicolas Reiss ◽  
Nikola Bursac ◽  
Thilo Richter
2017 ◽  
Vol 3 ◽  
Author(s):  
Albert Albers ◽  
Matthias Behrendt ◽  
Simon Klingler ◽  
Nicolas Reiß ◽  
Nikola Bursac

Most products are developed in generations. This needs to be considered with regard to development methods and processes to make existing knowledge available to achieve increased efficiency. To realize this, the approach of PGE – product generation engineering – is formulated. Product generation engineering is understood as the development of products based on reference products (precursor or competitor products). The subsystems are either adapted to the new product generation by means of carryover or they are newly developed based on shape variation or principle variation. Validation is considered as the central activity in the product engineering process and is a major challenge, especially for complex mechatronic systems. Therefore, it is important to understand validation as an ongoing activity during product development. The pull principle of validation describes the definition and development of validation activities, including models and validation environments based on specific validation objectives. In order to have effectiveness within validation of subsystems, it is necessary to map the interactions with the overall system, namely the super-system. The relevant subsystems can be connected under consideration of functional and energetic aspects by means of virtual, physical or mixed virtual–physical modeling applied by the holistic IPEK-X-in-the-Loop approach within the integrated Product engineering Model (iPeM).


Konstruktion ◽  
2020 ◽  
Vol 72 (11-12) ◽  
pp. 76-83
Author(s):  
Jens Pottebaum ◽  
Iris Gräßler

Inhalt Unscharfe Anforderungen, verschiedene Lösungs-alternativen oder eingeschränkt gültige Simulationsmodelle sind Beispiele für inhärente Unsicherheit in der Produktentwicklung. Im vorliegenden Beitrag wird ein modellbasierter Ansatz vorgestellt, der das industriell etablierte Denken in Sicherheitsfaktoren um qualitative Aspekte ergänzt. Modelle der Informationsqualität helfen, die Unsicherheit von Ent- wicklungsartefakten beschreibend zu charakterisieren. Mittels semantischer Technologien wird Unsicherheit so wirklich handhabbar – nicht im Sinne einer Berechnung, sondern im Sinne einer qualitativen Interpretation. Dadurch entsteht wertvolles Wissen für die iterative Anforderungsanalyse, die Bewertung alternativer System-Architekturen oder für die Rekonfiguration von Simulationen.


Author(s):  
Florian Marthaler ◽  
Sven Stahl ◽  
Andreas Siebe ◽  
Nikola Bursac ◽  
Markus Spadinger ◽  
...  

AbstractDuring the process of product engineering, decisions with uncertain consequences have to be made about future development (Albers et al., 2017a). Customer, user and vendor requirements that are already known and those who are relevant for the future have to be recognized and transferred into consistent projects. Classical approaches like customer surveys or market analyses are only partially useful for anticipating or validating future product requirements since they rather evaluate todays situation. Methods of foresight are preferably applied to make decisions under circumstances of uncertainty and to generate future knowledge. The following work treats thus a system that enables the user to deduce future requirements based on trend analyses. The system which was first mentioned in Albers et al. and further developed in Marthaler et al. will serve as the basis. (Albers et al., 2018a; Marthaler et al., 2019). The goal is to present and evaluate a system based on the analysis and identification of trends that allows to identify robust requirements for future product generations and to transfer them into concrete development agreements in the form of a development road map.


1969 ◽  
Author(s):  
Richard I. Lanyon ◽  
Anthony Broskowski

Author(s):  
D.S. Patrick ◽  
L.C. Wagner ◽  
P.T. Nguyen

Abstract Failure isolation and debug of CMOS integrated circuits over the past several years has become increasingly difficult to perform on standard failure analysis functional testers. Due to the increase in pin counts, clock speeds, increased complexity and the large number of power supply pins on current ICS, smaller and less equipped testers are often unable to test these newer devices. To reduce the time of analysis and improve the failure isolation capabilities for failing ICS, failure isolation is now performed using the same production testers used in product development, multiprobe and final test. With these production testers, the test hardware, program and pattern sets are already available and ready for use. By using a special interface that docks the production test head to failure isolation equipment such as the emission microscope, liquid crystal station and E-Beam prober, the analyst can quickly and easily isolate the faillure on an IC. This also enables engineers in design, product engineering and the waferfab yield enhancement groups to utilize this equipment to quickly solve critical design and yield issues. Significant cycle time savings have been achieved with the migration to this method of electrical stimulation for failure isolation.


2021 ◽  
Vol 1 ◽  
pp. 3229-3238
Author(s):  
Torben Beernaert ◽  
Pascal Etman ◽  
Maarten De Bock ◽  
Ivo Classen ◽  
Marco De Baar

AbstractThe design of ITER, a large-scale nuclear fusion reactor, is intertwined with profound research and development efforts. Tough problems call for novel solutions, but the low maturity of those solutions can lead to unexpected problems. If designers keep solving such emergent problems in iterative design cycles, the complexity of the resulting design is bound to increase. Instead, we want to show designers the sources of emergent design problems, so they may be dealt with more effectively. We propose to model the interplay between multiple problems and solutions in a problem network. Each problem and solution is then connected to a dynamically changing engineering model, a graph of physical components. By analysing the problem network and the engineering model, we can (1) derive which problem has emerged from which solution and (2) compute the contribution of each design effort to the complexity of the evolving engineering model. The method is demonstrated for a sequence of problems and solutions that characterized the early design stage of an optical subsystem of ITER.


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