Preparation of variable-thickness MgB2 thin film bridges by AFM nanolithography

2006 ◽  
Vol 435 (1-2) ◽  
pp. 82-86 ◽  
Author(s):  
M. Gregor ◽  
A. Plecenik ◽  
T. Plecenik ◽  
M. Tomasek ◽  
P. Kus ◽  
...  
Keyword(s):  
Thin Film ◽  
Variable Thickness ◽  
Mgb2 Thin Film

Microstructure of MgB2 thin film deposited on r-plane sapphire substrate by co-evaporation method

2009 ◽  
Vol 469 (15-20) ◽  
pp. 1571-1573 ◽  
Author(s):  
S.G. Kang ◽  
S.C. Park ◽  
J.-K. Chung ◽  
D.G. Jeong ◽  
C.-J. Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Sapphire Substrate ◽  
Evaporation Method ◽  
Mgb2 Thin Film

Comparative Study on Transport and Magnetic J c of Textured MgB2 Thin Film

2010 ◽  
Vol 23 (6) ◽  
pp. 1031-1034
Author(s):  
Y. Ding ◽  
H. Lv ◽  
Y. X. Zhang ◽  
Z. X. Shi
Keyword(s):  
Thin Film ◽  
Comparative Study ◽  
Mgb2 Thin Film

1/f Noise in the superconducting transition of a MgB2 thin film

2010 ◽  
Vol 470 (9-10) ◽  
pp. 451-455 ◽  
Author(s):  
B. Lakew ◽  
S. Aslam ◽  
H. Jones ◽  
T. Stevenson ◽  
N. Cao
Keyword(s):  
Thin Film ◽  
Superconducting Transition ◽  
Mgb2 Thin Film

scholarly journals Magnetic instability of MgB2 thin film triggered by the various sweeping rates of an applied magnetic field

2010 ◽  
Vol 107 (1) ◽  
pp. 013902 ◽  
Author(s):  
Jae-Yeap Lee ◽  
Hu-Jong Lee ◽  
Myung-Hwa Jung ◽  
Sung-Ik Lee ◽  
Eun-Mi Choi ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Film ◽  
Applied Magnetic Field ◽  
Magnetic Instability ◽  
Mgb2 Thin Film

scholarly journals Fabrication and characterization of superconducting MgB2 thin film on graphene

AIP Advances ◽  
2018 ◽  
Vol 8 (7) ◽  
pp. 075015 ◽  
Author(s):  
Shu-Han Cheng ◽  
Yan Zhang ◽  
Hong-Zhang Wang ◽  
Yu-Long Li ◽  
Can Yang ◽  
...  
Keyword(s):  
Thin Film ◽  
Mgb2 Thin Film ◽  
Fabrication And Characterization

Manufacturing of a Linear Variable Filter for Spectral Order Sorting

2015 ◽  
Vol 661 ◽  
pp. 156-161
Author(s):  
Cheng Hao Ko ◽  
Kuei Ying Chang ◽  
You Min Huang ◽  
Jih Run Tsai ◽  
Bang Ji Wang
Keyword(s):  
Thin Film ◽  
Theoretical Model ◽  
Film Thickness ◽  
Variable Thickness ◽  
Diffraction Grating ◽  
Coating System ◽  
Thin Film Thickness ◽  
Spectral Order ◽  
First Order ◽  
Linear Variable Filter

An analytical thin film thickness model based on the geometry of a commercial vacuum coating system is proposed. This model can calculate the profiles of linear variable filters (LVFs), which are used to eliminate overlapping orders of spectra due to the use of a diffraction grating and which are fabricated using a local mask, producing a linearly variable thickness. While the filter transmits the first-order wavelength and blocks the second-order wavelength. The 75% and 25% relative thicknesses deviation between the evaporated film and the theoretical model is less than 5%, indicating good suitability for LVF design and fabrication.

Compliant Substrates for Reduction of Strain Relief in Mismatched Overlayers

1996 ◽  
Vol 441 ◽  
Author(s):  
Carrie Carter-Coman ◽  
Robert Bicknell-Tassius ◽  
April S. Brown ◽  
Nan Marie Jokerst
Keyword(s):  
Thin Film ◽  
Variable Thickness ◽  
Critical Thickness ◽  
Strain Relief ◽  
Compliant Substrate ◽  
Compliant Substrates ◽  
Experimental Strain

AbstractThin film compliant substrates can be used to extend the critical thickness in mismatched overlayers. A metastability model has been coupled with recent experimental strain relief data to determine the critical thickness of InGaAs epilayers grown on GaAs compliant substrates of variable thickness. The results of this model are also compared to other compliant substrate critical thickness models.

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