Effect of Au8+ irradiation on Ni/n-GaP Schottky diode: Its influence on interface state density and relaxation time

2017 ◽  
Vol 504 ◽  
pp. 133-138 ◽  
Author(s):  
N. Shiwakoti ◽  
A. Bobby ◽  
K. Asokan ◽  
Bobby Antony
Keyword(s):  
Relaxation Time ◽  
Schottky Diode ◽  
Interface State ◽  
State Density ◽  
Interface State Density

scholarly journals A high speed PE-ALD ZnO Schottky diode rectifier with low interface-state density

2018 ◽  
Vol 51 (6) ◽  
pp. 065102 ◽  
Author(s):  
Jidong Jin ◽  
Jiawei Zhang ◽  
Andrew Shaw ◽  
Valeriya N Kudina ◽  
Ivona Z Mitrovic ◽  
...  
Keyword(s):  
Schottky Diode ◽  
High Speed ◽  
Interface State ◽  
State Density ◽  
Interface State Density

Effect of annealing on interface state density of Ni-silicided/Si1−xGex Schottky diode

2005 ◽  
Vol 8 (1-3) ◽  
pp. 249-253 ◽  
Author(s):  
A.R. Saha ◽  
S. Chattopadhyay ◽  
G.K. Dalapati ◽  
C. Bose ◽  
C.K. Maiti
Keyword(s):  
Schottky Diode ◽  
Interface State ◽  
State Density ◽  
Interface State Density

scholarly journals Electrical Characterization and Interface State Density in Au/n-InN/InP Schottky Diode

2021 ◽  
Vol 13 (4) ◽  
pp. 04002-1-04002-5
Author(s):  
A. H. Khediri ◽  
◽  
A. Talbi ◽  
M. A. Benamara ◽  
Z. Benamara ◽  
...  
Keyword(s):  
Schottky Diode ◽  
Electrical Characterization ◽  
Interface State ◽  
State Density ◽  
Interface State Density

Electronic and interface state density distribution properties of Ag/p-Si Schottky diode

2005 ◽  
Vol 252 (5) ◽  
pp. 1966-1973 ◽  
Author(s):  
Mustafa Okutan ◽  
Engin Basaran ◽  
Fahrettin Yakuphanoglu
Keyword(s):  
Density Distribution ◽  
Schottky Diode ◽  
Interface State ◽  
State Density ◽  
Interface State Density

Extraction of interface state density of Pt/p-strained-Si Schottky diode

1998 ◽  
Vol 335 (1-2) ◽  
pp. 142-145 ◽  
Author(s):  
S. Chattopadhyay ◽  
L.K. Bera ◽  
S.K. Ray ◽  
P.K. Bose ◽  
C.K. Maiti
Keyword(s):  
Schottky Diode ◽  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Strained Si

Interface-State-Density Evaluation of p-type and n-type Ge/GeNx Structures by Conductance Technique

2013 ◽  
Vol 133 (7) ◽  
pp. 1279-1284
Author(s):  
Takuro Iwasaki ◽  
Toshiro Ono ◽  
Yohei Otani ◽  
Yukio Fukuda ◽  
Hiroshi Okamoto
Keyword(s):  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Conductance Technique ◽  
Density Evaluation ◽  
P Type
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