Preliminary study of window silicate glass powder for EPR dosimetry with 10-MeV electron beam irradiation

2012 ◽  
Vol 274 ◽  
pp. 135-138 ◽  
Author(s):  
Ali Ramezani Moghaddam ◽  
Mojtaba Shamsaei ◽  
Reza Amraei
Keyword(s):  
Electron Beam ◽  
Silicate Glass ◽  
Electron Beam Irradiation ◽  
Glass Powder ◽  
Beam Irradiation ◽  
Epr Dosimetry ◽  
Preliminary Study

Electron-beam irradiation-induced nonlinearity in silicate glass films and fabrication of nonlinear optical gratings

1999 ◽  
Vol 86 (5) ◽  
pp. 2393-2396 ◽  
Author(s):  
Makoto Nakanishi ◽  
Okihiro Sugihara ◽  
Naomichi Okamoto ◽  
Hisashi Fujimura ◽  
Chikara Egami
Keyword(s):  
Electron Beam ◽  
Silicate Glass ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Optical Gratings ◽  
Glass Films

A preliminary study on effect of additive in the removal of NOx and SO2 by electron beam irradiation

2020 ◽  
Vol 387 ◽  
pp. 124083 ◽  
Author(s):  
Seo Hee Seo ◽  
Sang-Hee Jo ◽  
Youn-Suk Son ◽  
Tae-Hun Kim ◽  
Tak-Hyun Kim ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Preliminary Study

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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