Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors (HEMTs) with high density silicon nitride passivation
2017 ◽
Vol 76-77
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pp. 287-291
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2021 ◽
Vol 135
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pp. 106109
2011 ◽
Vol 29
(3)
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pp. 031211
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2014 ◽
2013 ◽
Vol 66
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pp. 63-70
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