Back-end soft and hard defect monitoring using a single test chip

2011 ◽  
Vol 51 (6) ◽  
pp. 1136-1141
Author(s):  
Fabrice Rigaud ◽  
Jean-Michel Portal ◽  
Hassen Aziza ◽  
Didier Nee ◽  
Julien Vast ◽  
...  
Keyword(s):  
Impact ◽  
2019 ◽  
Vol 2019 (10) ◽  
pp. 73-75
Author(s):  
Susumu Hara

Professor Susumu Hara is based at the Department of Aerospace Engineering, Nagoya University in Japan explains that when the Mars rover Opportunity was set to land on that planet in the first weeks of 2004, onlookers held their breath as it dropped from orbit and hurtled toward the red surface. 'Any failure in the calculations or landing systems would mean a harder than expected impact,' he highlights. 'The impacts sustained by a rover such as Opportunity can derail a mission before it even starts, damaging cargo or vital systems required to complete the mission.' Impacts occur during landing but also as the craft enters the atmosphere, when it makes sudden moves, while it is on surface or when debris strikes it. 'Therefore, a system and materials to protect a craft are vital,' outlines Hara. 'Surprisingly, the solutions to this problem are not sophisticated. In fact, most craft still employ devices resembling automobile bumpers, which absorb the energy from an impact by crumpling under the force of said impact.' Unfortunately, these cannot be reused, even during testing phases a new prototype is required after every single test run. Recent missions also employed techniques like airbags or sky cranes. While successful they too have drawbacks. 'Airbags create huge rebounds which can jostle the craft and the contents inside while sky cranes are extremely costly to develop,' Hara says. For this reason, he is dedicated to designing a new highly reliable and cost-effective shock control mechanism.


Electronics ◽  
2021 ◽  
Vol 10 (4) ◽  
pp. 443
Author(s):  
Mihaela-Daniela Dobre ◽  
Philippe Coll ◽  
Gheorghe Brezeanu

This paper proposes an investigation of a CDM (charge device model) electrostatic discharge (ESD) protection method used in submicronic input–output (I/O) structures. The modeling of the commonly used ESD protection devices as well as the modeling of the breakdown caused by ESD is not accurate using traditional commercial tools, hence the need for test-chip implementation, whenever a new technology node is used in production. The proposed method involves defining, implementing, testing, and concluding on one test-chip structure named generically “CDM ground resistance”. The structure assesses the maximum ground resistance allowed for the considered technology for which CDM protection is assured. The findings are important because they will be actively used as CDM protection for all I/O structures developed in the considered submicronic technology node. The paper will conclude on the constraints in terms of maximum resistance of ground metal track allowed to be CDM protected.


2020 ◽  
Vol 59 (52) ◽  
pp. 23862-23869 ◽  
Author(s):  
Estela Climent ◽  
Mustafa Biyikal ◽  
Delia Gröninger ◽  
Michael G. Weller ◽  
Ramón Martínez‐Máñez ◽  
...  

2017 ◽  
Vol 38 (05) ◽  
pp. 378-383 ◽  
Author(s):  
Filipe de Barros Sousa ◽  
Natalia Rodrigues ◽  
Leonardo Messias ◽  
Jair Queiroz ◽  
Fulvia Manchado-Gobatto ◽  
...  

1983 ◽  
Vol 29 (4) ◽  
pp. 688-691 ◽  
Author(s):  
R W Kineiko ◽  
D A Floering ◽  
M Morrissey

Abstract We evaluated a new multi-channel chemistry analyzer, the Hitachi 705 Automatic Analyzer, marketed by Boehringer Mannheim Diagnostics, Inc. The instrument is a computer-controlled discrete analyzer, which can be run in a combination profile mode and single-test mode. Sixteen different tests per sample may be performed at the rate of 180 tests per hour. The Hitachi 705 is especially suitable for use in hospitals that do not perform profile testing. Precision and linearity were excellent and the instrument was relatively trouble-free, with little operator attention required during operation. The Hitachi 705 was easily interfaced to our laboratory computer. We compared the performance of the instrument with that of the Du Pont aca; the two instruments compared favorably.


2014 ◽  
Vol 16 (12) ◽  
pp. 962-971 ◽  
Author(s):  
Helen R. Griffin ◽  
Angela Pyle ◽  
Emma L. Blakely ◽  
Charlotte L. Alston ◽  
Jennifer Duff ◽  
...  

Author(s):  
D J Worthington ◽  
E M Hammond ◽  
B B Eldeeb ◽  
A Green ◽  
G M Addison ◽  
...  

The overproduction of catecholamines and their metabolites is a well recognised feature of neuroblastoma. Published data are scarce for their urinary excretion in children with neuroblastoma and in ill children in whom this diagnosis may be considered. We have determined a graphical upper reference limit for total catecholamines, total metadrenalines and HMMA in urine, expressed as a ratio to the creatinine concentration, for a group of 174 children with neuroblastoma and 704 hospitalised children with other disorders. This graph has been determined by examining the overlap region between the results for the two groups of children and avoids the irregularities caused by statistical outliers. The sensitivity and specificity of the individual tests indicate that total catecholamines is marginally the best single test to perform when trying to diagnose neuroblastoma, with the best clinical sensitivity being achieved by examining both total catecholamines and HMMA. Only two of the 174 children with neuroblastoma would not have been detected using these two tests. Total metadrenalines did not appear to add any further information and could be dropped from the repertoire in favour of the other two measurements.


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