Epitaxy of BaTiO3 thin film on Si(001) using a SrTiO3 buffer layer for non-volatile memory application

2011 ◽  
Vol 88 (7) ◽  
pp. 1232-1235 ◽  
Author(s):  
G. Niu ◽  
S. Yin ◽  
G. Saint-Girons ◽  
B. Gautier ◽  
P. Lecoeur ◽  
...  
2004 ◽  
Vol 3 (12) ◽  
pp. 918-922 ◽  
Author(s):  
Jianyong Ouyang ◽  
Chih-Wei Chu ◽  
Charles R. Szmanda ◽  
Liping Ma ◽  
Yang Yang

2019 ◽  
Vol 6 (9) ◽  
pp. 096429 ◽  
Author(s):  
Kiran D More ◽  
Vijaykiran N Narwade ◽  
Devidas I Halge ◽  
Jagdish W Dadge ◽  
Rajendra S Khairnar ◽  
...  

2014 ◽  
Vol 602-603 ◽  
pp. 1056-1059 ◽  
Author(s):  
Min Chang Kuan ◽  
Fann Wei Yang ◽  
Chien Min Cheng ◽  
Kai Huang Chen ◽  
Jian Tz Lee

Up to now, the various non-volatile memory devices such as, ferroelectric random access memory (FeRAM), magnetron random access memory (MRAM), and resistance random access memory (RRAM) were widely discussed and investigated. For these nonvolatile memory devices, the resistance random access memory (RRAM) devices will play an important role because of its non-destructive readout, low operation voltage, high operation speed, long retention time, and simple structure. The resistance random access memory (RRAM) devices were only consisting of one resistor and one corresponding transistor. The subject of this work was to study the characteristics of manganese oxide (MnO) thin films deposited on transparent conductive thin film using the rf magnetron sputtering method. The optimal sputtering conditions of as-deposited manganese oxide (MnO) thin films were the rf power of 80 W, chamber pressure of 20 mTorr, substrate temperature of 580°C, and an oxygen concentration of 40%. The basic mechanisms for the bistable resistance switching were observed. In which, the non-volatile memory and switching properties of the manganese oxide (MnO) thin film structures were reported and the relationship between the memory windows and electrical properties was investigated.


RSC Advances ◽  
2015 ◽  
Vol 5 (12) ◽  
pp. 8566-8570 ◽  
Author(s):  
Jim-Long Her ◽  
Fa-Hsyang Chen ◽  
Ching-Hung Chen ◽  
Tung-Ming Pan

In this study, we report the structural and electrical characteristics of high-κ Sm2O3 and SmTiO3 charge trapping layers on an indium–gallium–zinc oxide (IGZO) thin-film transistor (TFT) for non-volatile memory device applications.


2015 ◽  
Vol 66 (4) ◽  
pp. 235-237
Author(s):  
Zsolt J. Horváth

Abstract A new type of transfer logic gates with both electrical and/or optical inputs and electrical outputs are proposed, which can be prepared by thin film technology. The possible realization of different logic functions and non-volatile memory logic arrays are demonstrated. The possible application fields are briefly discussed.


2011 ◽  
Vol 519 (15) ◽  
pp. 5208-5211 ◽  
Author(s):  
W.K. Lee ◽  
K.C. Aw ◽  
H.Y. Wong ◽  
K.Y. Chan ◽  
M. Leung ◽  
...  

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