An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors
2015 ◽
Vol 118
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pp. 248-257
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2013 ◽
Vol 718-720
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pp. 750-755
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1998 ◽
Vol 46
(11)
◽
pp. 1620-1627
◽
2002 ◽
Vol 12
(3)
◽
pp. 51-56
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