2011 IEEE ICMTS International Conference on Microelectronic Test Structures
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Published By IEEE

9781424485260, 9781424485291

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Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976846 ◽

2011 ◽

Cited By ~ 3

Author(s):

Yi-Jung Jung ◽

Byoung-Seok Park ◽

In-Shik Han ◽

Hyuk-Min Kwon ◽

Sang-Uk Park ◽

...

Keyword(s):

High Performance ◽

Test Structure

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Interdigitated electrode modelling for applications in dielectrophoresis

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976863 ◽

2011 ◽

Author(s):

C. Chung ◽

S. Smith ◽

A. Menachery ◽

P. Bagnaninchi ◽

A. J. Walton ◽

...

Keyword(s):

Interdigitated Electrode

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Device variability and correlation control by automated tuning of SPICE cards to PCM measurements

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976877 ◽

2011 ◽

Author(s):

Alberto Revelant ◽

Luca Lucci ◽

Luca Selmi ◽

Benno Ankele

Keyword(s):

Automated Tuning

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Admittance characterization and interface trap property extraction for Ge/III-V MOS structures

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976850 ◽

2011 ◽

Author(s):

Koen Martens

Keyword(s):

Interface Trap ◽

Mos Structures

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Modeling the frequency dependence of MOSFET gate capacitance

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976853 ◽

2011 ◽

Cited By ~ 1

Author(s):

Zeqin Zhu ◽

Gennady Gildenblat ◽

Colin C. McAndrew ◽

Ik-Sung Lim

Keyword(s):

Frequency Dependence ◽

Gate Capacitance

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Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976870 ◽

2011 ◽

Cited By ~ 2

Author(s):

Gianpaolo Lorito ◽

Lin Qi ◽

L. K. Nanver

Keyword(s):

Surface Doping

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Front cover

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976849 ◽

2011 ◽

Keyword(s):

Front Cover

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Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976842 ◽

2011 ◽

Cited By ~ 1

Author(s):

Helmut Kock ◽

Robert Illing ◽

Thomas Ostermann ◽

Stefan Decker ◽

Donald Dibra ◽

...

Keyword(s):

Temperature Sensor ◽

Test Chip

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Exploring capacitance-voltage measurements to find the piezoelectric coefficient of aluminum nitride

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976862 ◽

2011 ◽

Cited By ~ 3

Author(s):

T. van Hemert ◽

D. Sarakiotis ◽

S. Jose ◽

R. J. E. Hueting ◽

J. Schmitz

Keyword(s):

Aluminum Nitride ◽

Piezoelectric Coefficient ◽

Capacitance Voltage

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Matching characteristics of metal resistors

2011 IEEE ICMTS International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2011.5976844 ◽

2011 ◽

Author(s):

Hiroaki Namba ◽

Takasuke Hashimoto ◽

Kenji Hayashi ◽

Masayuki Furumiya

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2011 IEEE ICMTS International Conference on Microelectronic Test StructuresLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

Interdigitated electrode modelling for applications in dielectrophoresis

Device variability and correlation control by automated tuning of SPICE cards to PCM measurements

Admittance characterization and interface trap property extraction for Ge/III-V MOS structures

Modeling the frequency dependence of MOSFET gate capacitance

Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

Front cover

Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology

Exploring capacitance-voltage measurements to find the piezoelectric coefficient of aluminum nitride

Matching characteristics of metal resistors

2011 IEEE ICMTS International Conference on Microelectronic Test Structures
Latest Publications