A method to realize high-precision and large laser thermal bending angle

2021 ◽  
Vol 62 ◽  
pp. 168-178
Author(s):  
Yankuo Guo ◽  
Yongjun Shi ◽  
Xiaogang Wang ◽  
Rui Sun ◽  
Xianfa Li
Keyword(s):  
High Precision ◽  
Bending Angle ◽  
Thermal Bending

scholarly journals High Precision, Small Size and Flexible FBG Strain Sensor for Slope Model Monitoring

Sensors ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 2716 ◽  
Author(s):  
Hongbin Xu ◽  
Xinyu Zheng ◽  
Weigang Zhao ◽  
Xu Sun ◽  
Feng Li ◽  
...  
Keyword(s):  
High Precision ◽  
Strain Sensor ◽  
Horizontal Displacement ◽  
Steel Plates ◽  
Flexible Structure ◽  
Test Results ◽  
Bending Angle ◽  
Subsurface Deformation ◽  
Measurement Results ◽  
Sensor Monitoring

In this paper, a soft fiber Bragg grating (FBG) strain sensor was constructed of a rubber strip, FBGs and steel plates, which exhibits the advantages of high precision and a small size. A series of FBGs was uniformly pasted on a flexible rubber strip which can monitor the slope deformation by measuring the bending deformation of the rubber strip. Most notably, this sensor can be used to monitor horizontal displacement in the subsurface of the slope model. The relationships among the bending angle of the rubber strip, the strain of the rubber strip, and the subsurface deformation of the slope model were established. In addition, the subsurface deformation of the slope model can be obtained by the FBG strain sensor monitoring. Since a rigid-flexible structure was formed by uniformly pasting a series of steel plates on the other side of the rubber strip, the sensitivity of the FBG strain sensor was improved to be 1.5425 nm/°. The measurement results verify that the FBG strain sensor shows good performance, and the model test results demonstrate that the FBG strain sensor can be used for monitoring the subsurface deformation of the slope model.

Analysis and Prediction of the In-Plane Deformation in Laser Thermal Adjustment

2012 ◽  
Vol 134 (4) ◽  
Author(s):  
Hong Shen ◽  
Jun Hu ◽  
Zhenqiang Yao
Keyword(s):  
Analytical Model ◽  
High Precision ◽  
Laser Processing ◽  
Plane Deformation ◽  
Experimental Results ◽  
Laser Forming ◽  
Bending Angle ◽  
Heating Stage ◽  
Plane Bending ◽  
Bending Angles

Laser thermal adjustment as an application of laser forming in microsystems has received considerable attentions in recent years. This process is a noncontact and high precision forming method. The traditional mechanical microforming technologies for the adjustment step used in microsystem assembly are often limited in their accuracy and are also time consuming. This paper presents an analytical model for describing the in-plane deformation of actuators during laser thermal adjustment. A formula for calculating the in-plane bending angle of the actuator generated by the laser processing is derived. The proposed analytical model is demonstrated by the comparison of the predicted bending angles with the numerical and experimental results. Finally, a formula to predict the possible buckling of the actuator during the laser processing is also developed, from which one can design the opening of the actuator in order to avoid the buckling of the actuator during a heating stage of the process.

An Energy Analyser for Contrast Enhancement in STEM

1974 ◽  
Vol 32 ◽  
pp. 434-435
Author(s):  
H.T. Pearce-Percy
Keyword(s):  
Contrast Enhancement ◽  
Bending Angle ◽  
Magnetic Sector ◽  
Conventional Design ◽  
Bending Radius ◽  
Sector Type

Recently an energy analyser of the uniform magnetic sector type has been installd in a 100KV microscope. This microscope can be used in the STEM mode. The sector is of conventional design (Fig. 1). The bending angle was chosen to be 90° for ease of construction. The bending radius (ρ) is 20 cm. and the object and image distances are 42.5 cm. and 30.0 cm. respectively.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

High precision measurement of the SOS surface thickness in the rough phase

1991 ◽  
Vol 1 (12) ◽  
pp. 1669-1673 ◽  
Author(s):  
Hans Gerd Evertz ◽  
Martin Hasenbusch ◽  
Mihail Marcu ◽  
Klaus Pinn ◽  
Sorin Solomon
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
High Precision Measurement ◽  
Surface Thickness
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