The influence of oxidation with HNO3 on the surface composition of high-sulphur coals: XPS study

2006 ◽  
Vol 87 (11) ◽  
pp. 1021-1029 ◽  
Author(s):  
Robert Pietrzak ◽  
Helena Wachowska
Keyword(s):  
Surface Composition ◽  
Xps Study

XPS study of the surface composition modification of nc-TiC/C nanocomposite films under in situ argon ion bombardment

2011 ◽  
Vol 519 (12) ◽  
pp. 3982-3985 ◽  
Author(s):  
A.A. El Mel ◽  
B. Angleraud ◽  
E. Gautron ◽  
A. Granier ◽  
P.Y. Tessier
Keyword(s):  
Surface Composition ◽  
Ion Bombardment ◽  
Nanocomposite Films ◽  
Composition Modification ◽  
Argon Ion Bombardment ◽  
Xps Study ◽  
Argon Ion

XPS Study of Polyimide H-Film After Heat Treatment and Laser Processing

1989 ◽  
Vol 154 ◽  
Author(s):  
P.V. Nagarkar ◽  
E.K. Sichela ◽  
G.L. Doll
Keyword(s):  
Heat Treatment ◽  
Electrical Resistivity ◽  
Photoelectron Spectroscopy ◽  
Laser Processing ◽  
Surface Composition ◽  
Carbonyl Groups ◽  
X Ray ◽  
Heat Treated ◽  
Rapid Changes ◽  
Xps Study

AbstractAn x-ray photoelectron spectroscopy (XPS) study of laser treated and heat treated Kapton®indicates that both the treatments result in depleting the carbonyl groups from the sample and leave behind a conducting residue that still contains significant amounts of oxygen and nitrogen. The rapid changes in surface composition coincide with a substantial decrease in the electrical resistivity of the polyimide samples.

XPS Study of Surface Composition of a Segmented Polyurethane Block Copolymer Modified by PDMS End Groups and Its Blends with Phenoxy

1997 ◽  
Vol 30 (23) ◽  
pp. 7206-7213 ◽  
Author(s):  
Jianming Wen ◽  
Gabor Somorjai ◽  
Florencia Lim ◽  
Robert Ward
Keyword(s):  
Block Copolymer ◽  
Surface Composition ◽  
Segmented Polyurethane ◽  
End Groups ◽  
Xps Study

Surface composition of PdCuAu ternary alloys: a combined LEIS and XPS study

2015 ◽  
Vol 47 (7) ◽  
pp. 745-754 ◽  
Author(s):  
Ana M. Tarditi ◽  
Carolina Imhoff ◽  
James B. Miller ◽  
Laura Cornaglia
Keyword(s):  
Surface Composition ◽  
Ternary Alloys ◽  
Xps Study

The surface composition of silicon carbide powders and whiskers: An XPS study

1989 ◽  
Vol 4 (1) ◽  
pp. 189-203 ◽  
Author(s):  
T. N. Taylor
Keyword(s):  
Silicon Carbide ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Peak Position ◽  
Variable Degree ◽  
Xps Spectra ◽  
Frequency Plasma ◽  
Commercial Process ◽  
Xps Study ◽  
Composite Silicon

The surface composition and bonding of a wide variety of silicon carbide powders and whiskers have been characterized by x-ray photoelectron spectroscopy (XPS). Ultrafine SiC powders, grown by a radio frequency plasma process, have been shown to exhibit graphitic carbon and a thin suboxide coating. Whiskers of SiC, grown in a vapor-liquid-solid or proprietary commercial process, were generally covered by heavier oxides than the powders and to a variable degree showed silica-like bonding. Most of the materials were subject to sample charging. Procedures were developed to estimate these charging effects and interpret the complete catalog of XPS spectra from these materials with respect to Fermi-level assignments. Charge independent quantities, such as oxygen Auger parameter and O(1s)–Si(2p) peak position difference, were found to agree with accepted values in the literature while exhibiting trends consistent with suboxide and silica bonding assignments. The data give a broad basis for understanding the feedstock surface chemistry which is involved during fabrication of monolithic or composite silicon carbide materials.

XPS study of the surface composition of modified nickel-cobalt powder catalysts for enantioselective ethyl acetoacetate hydrogenation

2007 ◽  
Vol 56 (11) ◽  
pp. 2344-2347 ◽  
Author(s):  
N. D. Zubareva ◽  
O. P. Tkachenko ◽  
N. S. Telegina ◽  
G. V. Dorokhin ◽  
E. I. Klabunovsky ◽  
...  
Keyword(s):  
Ethyl Acetoacetate ◽  
Surface Composition ◽  
Cobalt Powder ◽  
Nickel Cobalt ◽  
Xps Study

Adsorption and Thermal Decomposition of Tetrakis(dimethylamido)titanium on Si and SiO2/Si Surfaces: an XPS Study

1995 ◽  
Vol 60 (3) ◽  
pp. 372-382 ◽  
Author(s):  
Michaela Janovská ◽  
Zdeněk Bastl
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Multiple Bond ◽  
Photoelectron Spectra ◽  
Surface Species ◽  
Oxide Formation ◽  
Si Substrate ◽  
X Ray ◽  
Nitride Coatings ◽  
Xps Study

X-Ray photoelectron spectroscopy (XPS) has been used to study adsorption of tetrakis(dimethylamido)titanium (TDMT) on a clean Si surface and surface on which an oxide layer was grown prior to TDMT adsorption. Measurements were carried out at temperatures 80 and 295 K. In addition, decomposition of TDMT on the above substrates yielding titanium nitride coatings was investigated. The change in surface composition as a function of TiNx layer thickness was monitored by XPS. Adsorption at 80 K proceeds without dissociation on both substrates. Photoelectron spectra measured at 295 K indicate presence of surface species containing C-N multiple bond on both substrates and on SiO2/Si substrate formation of species that contain Ti-N-C rings. At 580 K an overlayer consisting predominantly of TiNx was produced by pyrolysis of TDMT. The photoelectron spectra revealed also presence of species with C-N-C, Si-CHx and Ti-C bonds the concentration of which depended on an overlayer thickness. On SiO2/Si substrate decomposition of SiO2 accompanied by titanium oxide formation occurs during initial stages of TDMT pyrolysis.

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