Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

2007 ◽  
Vol 9 (6) ◽  
pp. 1311-1315 ◽  
Author(s):  
K. Eckhard ◽  
H. Shin ◽  
B. Mizaikoff ◽  
W. Schuhmann ◽  
C. Kranz
Keyword(s):  
Scanning Electrochemical Microscopy ◽  
Alternating Current ◽  
Ac Impedance ◽  
Impedance Imaging ◽  
Atomic Force ◽  
Electrochemical Microscopy

scholarly journals Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes from Pyrolyzed Parylene C

2013 ◽  
Vol 19 (S2) ◽  
pp. 46-47
Author(s):  
K.C. Morton ◽  
M.A. Derylo ◽  
A.E. Weber ◽  
L.A. Baker
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

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