Scanning Electrochemical Microscopy and Conductive Probe Atomic Force Microscopy Studies of Hydrogen-Terminated Boron-Doped Diamond Electrodes with Different Doping Levels

2004 ◽  
Vol 108 (39) ◽  
pp. 15117-15127 ◽  
Author(s):  
Katherine B. Holt ◽  
Allen J. Bard ◽  
Yoshiyuki Show ◽  
Greg M. Swain
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Diamond Electrodes ◽  
Boron Doped Diamond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Boron Doped ◽  
Electrochemical Microscopy

Boron-doped Diamond Electrodes: Electrochemical, Atomic Force Microscopy and Raman Study towards Corrosion-modifications at Nanoscale

2015 ◽  
Vol 179 ◽  
pp. 626-636 ◽  
Author(s):  
Ladislav Kavan ◽  
Zuzana Vlckova Zivcova ◽  
Vaclav Petrak ◽  
Otakar Frank ◽  
Pavel Janda ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diamond Electrodes ◽  
Boron Doped Diamond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Boron Doped ◽  
Raman Study

Atomic force microscopy probes with integrated boron doped diamond electrodes: Fabrication and application

2012 ◽  
Vol 25 ◽  
pp. 30-34 ◽  
Author(s):  
Alexander Eifert ◽  
Waldemar Smirnov ◽  
Stefan Frittmann ◽  
Christoph Nebel ◽  
Boris Mizaikoff ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diamond Electrodes ◽  
Boron Doped Diamond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Boron Doped

Diamond-Modified AFM Probes: From Diamond Nanowires to Atomic Force Microscopy-Integrated Boron-Doped Diamond Electrodes

2011 ◽  
Vol 83 (12) ◽  
pp. 4936-4941 ◽  
Author(s):  
Waldemar Smirnov ◽  
Armin Kriele ◽  
René Hoffmann ◽  
Eugenio Sillero ◽  
Jakob Hees ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diamond Electrodes ◽  
Boron Doped Diamond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Boron Doped

scholarly journals Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes from Pyrolyzed Parylene C

2013 ◽  
Vol 19 (S2) ◽  
pp. 46-47
Author(s):  
K.C. Morton ◽  
M.A. Derylo ◽  
A.E. Weber ◽  
L.A. Baker
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

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