Effect of a TiN alkali diffusion barrier layer on the physical properties of Mo back electrodes for CIGS solar cell applications

2017 ◽  
Vol 17 (12) ◽  
pp. 1747-1753 ◽  
Author(s):  
Weimin Li ◽  
Xia Yan ◽  
Armin G. Aberle ◽  
Selvaraj Venkataraj
Clean Energy ◽  
2019 ◽  
Vol 3 (3) ◽  
pp. 217-221
Author(s):  
Xinxian Jiang ◽  
Boyan Li ◽  
Binbin Song ◽  
Shuwang Zhang ◽  
Yang Qiu ◽  
...  

Abstract In this paper, pure titanium (Ti) thin films deposited by radio frequency sputtering were used as a diffusion barrier layer in a flexible copper indium gallium selenium (CIGS) solar cell on a stainless-steel foil and characterized by X-ray diffraction, scanning electron microscopy and second ion mass spectroscopy measurement methods. The influences of the magnetron sputtering pressure on the surface morphology and preferred crystal orientation of Ti films are discussed. It was found that the Ti film showed a (001) preferred orientation and smooth surface topography at lower deposition pressure, while (002) preferred orientation and relatively rough surface topography at higher deposition pressure. In addition, Ti films made with different process pressures were deposited as the barriers and the second ion mass spectroscopy results indicated that a Ti film with the thickness of 200 nm was able to effectively block Fe and Cr diffusion from the stainless-steel foil into the CIGS absorber across the molybdenum back contact. The Ti barrier significantly improved the conversion efficiency of the CIGS solar cell.


2008 ◽  
Vol 595-598 ◽  
pp. 107-116 ◽  
Author(s):  
Shigenari Hayashi ◽  
Mikihiro Sakata ◽  
Shigeharu Ukai ◽  
Toshio Narita

High temperature oxidation / creep deformation behavior of a diffusion barrier coated Hastelloy-X alloy, with large grain size ~500μm, was investigated at 970°C in air with external tensile stress of 22.5, 27.5, 32, and 40MPa. The diffusion barrier coating formed on Hastelloy-X consisted of a duplex structure with an inner diffusion barrier layer of Re-Cr-Ni alloy, and an outer oxidation resistant layer of β-NiAl. Un coated bare Hastelloy-X alloy with same grain size was also examined under the same conditions for comparison. The composition of the as-coated diffusion barrier coating was (15~21)Ni, (33~37)Cr, (30~33)Re, (11~15)Mo, and (9~14)Fe. This composition corresponds to σ-phase in the Ni-Cr-Re ternary system, which is known as a topologically close packed, TCP phase. The composition of this diffusion barrier layer did not change during the experiment. The oxide scales formed after creep testing on the coated and un-coated alloy surfaces were needle-like θ-Al2O3, and Cr2O3 with small amount of FeCr2O4, respectively. Grain boundary oxidation was also found in the subsurface region of the un-coated alloy. The Al2O3 scale exhibited severe spallation, and many cracks were formed perpendicular to the stress direction. However, no spallation or cracks were observed in the Cr2O3. The creep rupture times for the diffusion barrier coated alloy were about 1.5 times longer than those for bare alloy at all creep stress conditions. The fracture surface after rupture indicates that fracture occurred along alloy grain boundaries in both the coated and un-coated alloy substrate. Many cavities and cracks were observed within the diffusion barrier coated alloy substrate. These cavities and cracks tended to propagate from the substrate toward the diffusion barrier layer, and then stopped at the Re-Cr-Ni / β-NiAl interface. Cracks formed in the un-coated alloy initiated at the tip of grain boundary oxides, and propagated into alloy substrate. However no major cavities were observed inside the alloy substrate. The stress index, n, for both specimens was about 6, and this indicates that the deformation mechanism of both samples was dislocation creep. These results suggest that the Re-Cr-Ni diffusion barrier layer acts as a barrier against the movement of dislocations at the interface with the alloy surface.


2016 ◽  
Vol 2016 (4) ◽  
pp. 36-44 ◽  
Author(s):  
K.Yu. Yakovchuk ◽  
◽  
A.V. Mikitchik ◽  
Yu.E. Rudoy ◽  
A.O. Akhtyrsky ◽  
...  

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