Chemical bath deposited (CBD) CuO thin films on n-silicon substrate for electronic and optical applications: Impact of growth time

2017 ◽  
Vol 418 ◽  
pp. 380-387 ◽  
Author(s):  
Jenifar Sultana ◽  
Somdatta Paul ◽  
Anupam Karmakar ◽  
Ren Yi ◽  
Goutam Kumar Dalapati ◽  
...  
Keyword(s):  
Thin Films ◽  
Silicon Substrate ◽  
Growth Time ◽  
Optical Applications

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

2014 ◽  
Author(s):  
Stefan Prorok ◽  
Marvin Schulz ◽  
Alexander Petrov ◽  
Manfred Eich ◽  
Jingdong Luo ◽  
...  
Keyword(s):  
Thin Films ◽  
Silicon Substrate ◽  
Polymer Thin Films ◽  
Electro Optic

Oriented and polycrystalline NdNiO3 thin films on silicon substrate

2000 ◽  
Vol 211 (1-3) ◽  
pp. 111-117 ◽  
Author(s):  
P Laffez ◽  
M Zaghrioui ◽  
R Retoux ◽  
P Lacorre
Keyword(s):  
Thin Films ◽  
Silicon Substrate

Laser printing of azo-derivative thin films for non-linear optical applications

2015 ◽  
Vol 336 ◽  
pp. 200-205 ◽  
Author(s):  
Andreea Matei ◽  
Catalin Constantinescu ◽  
Bogdana Mitu ◽  
Mihaela Filipescu ◽  
Valentin Ion ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Printing ◽  
Non Linear ◽  
Linear Optical ◽  
Optical Applications

scholarly journals Structural and Mechanical Properties of Nanostructured C-Ag Thin Films Synthesized by Thermionic Vacuum Arc Method

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Rodica Vladoiu ◽  
Aurelia Mandes ◽  
Virginia Dinca-Balan ◽  
Vilma Bursikova
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Mechanical Properties ◽  
Elastic Modulus ◽  
Silicon Substrate ◽  
Vacuum Arc ◽  
Average Roughness ◽  
Thermionic Vacuum Arc ◽  
Induced Aggregation ◽  
Ag Film

Nanostructured C-Ag thin films of 200 nm thickness were successfully synthesized by the Thermionic Vacuum Arc (TVA) method. The influence of different substrates (glass, silicon wafers, and stainless steel) on the microstructure, morphology, and mechanical properties of nanostructured C-Ag thin films was characterized by High-Resolution Transmission Electron Microscopy (HRTEM), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and TI 950 (Hysitron) nanoindenter equipped with Berkovich indenter, respectively. The film’s hardness deposited on glass (HC-Ag/Gl = 1.8 GPa) was slightly lower than in the case of the C-Ag film deposited on a silicon substrate (HC-Ag/Si = 2.2 GPa). Also the apparent elastic modulus Eeff was lower for C-Ag/Gl sample (Eeff = 100 GPa) than for C-Ag/Si (Eeff = 170 GPa), while the values for average roughness are Ra=2.9 nm (C-Ag/Si) and Ra=10.6 (C-Ag/Gl). Using the modulus mapping mode, spontaneous and indentation-induced aggregation of the silver nanoparticles was observed for both C-Ag/Gl and C-Ag/Si samples. The nanocomposite C-Ag film exhibited not only higher hardness and effective elastic modulus, but also a higher fracture resistance toughness to the silicon substrate compared to the glass substrate.

scholarly journals Opto-Electronic Properties of Epoxy/Silicone Blend Based Thin Films

2021 ◽  
Author(s):  
Younes Ziat ◽  
Hamza Belkhanchi ◽  
Maryama Hammi ◽  
Charaf Laghlimi ◽  
A Moutcine
Keyword(s):  
Thin Films ◽  
Indium Tin Oxide ◽  
Optical Transition ◽  
Sol Gel ◽  
Glass Substrates ◽  
Nanostructured Thin Films ◽  
Ito Glass ◽  
Potential Applications ◽  
Optical Applications ◽  
Nitrogen Doped Carbon

Abstract Recently, the rise of two dimensional amorphous nanostructured thin films have ignited a big interest because of their intriguingly isotropic structural and physical properties leading to potential applications in the nano-optoelectronics. However, according to literature, most of optoelectronic properties are investigated on chalcogenides related heterostructures. This has motivated the present work aiming to provide a new platform for the fabrication, examination of the properties and the applications of 2D nanostructured thin films based on epoxy/silicone blend. Thin films of Epoxy/Silicone loaded with nitrogen doped carbon nanotubes (N-CNTs) were prepared by sol-gel method and deposited on Indium Tin Oxide (ITO) glass substrates at room temperature. Further examination of optical properties aimed the investigation of optical pseudo-gap and Urbach energy and enabled the determination of processed films thickness based on Manifacier and Swanepol method. The results indicated that the unloaded thin films have a direct optical transition with a value of 3.61 eV followed by noticeable shift towards narrowing gaps depending on the loading rate. Urbach's energy is 0.19 eV for the unloaded thin films, and varies from 0.43 to 1.33 eV for the loaded thin films with increasing the rate of N-CNTs. It is inversely variable with the optical pseudo-gap. Finally, Epoxy/Silicone loaded with N-CNTs nanocomposites films can be developed as active layers with specific optical characteristics, giving the possibility to be used in electro-optical applications.

Nanoindentation of GaN/SiC thin films on silicon substrate

2017 ◽  
Vol 102 ◽  
pp. 151-156 ◽  
Author(s):  
A.S. Grashchenko ◽  
S.A. Kukushkin ◽  
A.V. Osipov ◽  
A.V. Redkov
Keyword(s):  
Thin Films ◽  
Silicon Substrate

Nanomechanical study of thin film nanocomposite and PVD thin films on polymer substrates for optical applications

2013 ◽  
Vol 46 (48) ◽  
pp. 485303 ◽  
Author(s):  
Jonathan Moghal ◽  
Andrew Bird ◽  
Adrian H Harris ◽  
Ben D Beake ◽  
Martin Gardener ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Polymer Substrates ◽  
Optical Applications ◽  
Thin Film Nanocomposite
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