scholarly journals Structural and Mechanical Properties of Nanostructured C-Ag Thin Films Synthesized by Thermionic Vacuum Arc Method

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Rodica Vladoiu ◽  
Aurelia Mandes ◽  
Virginia Dinca-Balan ◽  
Vilma Bursikova
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Mechanical Properties ◽  
Elastic Modulus ◽  
Silicon Substrate ◽  
Vacuum Arc ◽  
Average Roughness ◽  
Thermionic Vacuum Arc ◽  
Induced Aggregation ◽  
Ag Film

Nanostructured C-Ag thin films of 200 nm thickness were successfully synthesized by the Thermionic Vacuum Arc (TVA) method. The influence of different substrates (glass, silicon wafers, and stainless steel) on the microstructure, morphology, and mechanical properties of nanostructured C-Ag thin films was characterized by High-Resolution Transmission Electron Microscopy (HRTEM), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and TI 950 (Hysitron) nanoindenter equipped with Berkovich indenter, respectively. The film’s hardness deposited on glass (HC-Ag/Gl = 1.8 GPa) was slightly lower than in the case of the C-Ag film deposited on a silicon substrate (HC-Ag/Si = 2.2 GPa). Also the apparent elastic modulus Eeff was lower for C-Ag/Gl sample (Eeff = 100 GPa) than for C-Ag/Si (Eeff = 170 GPa), while the values for average roughness are Ra=2.9 nm (C-Ag/Si) and Ra=10.6 (C-Ag/Gl). Using the modulus mapping mode, spontaneous and indentation-induced aggregation of the silver nanoparticles was observed for both C-Ag/Gl and C-Ag/Si samples. The nanocomposite C-Ag film exhibited not only higher hardness and effective elastic modulus, but also a higher fracture resistance toughness to the silicon substrate compared to the glass substrate.

scholarly journals Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method

Materials ◽  
2020 ◽  
Vol 13 (7) ◽  
pp. 1796
Author(s):  
Sebastian Cozma ◽  
Rodica Vlǎdoiu ◽  
Aurelia Mandes ◽  
Virginia Dinca ◽  
Gabriel Prodan ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Materials Science ◽  
Vacuum Arc ◽  
Silicon Substrates ◽  
Force Microscopy ◽  
Energy Evaluation ◽  
Transmission Electron ◽  
Potential Applications ◽  
Thermionic Vacuum Arc

The current work aimed to characterize the morphology, chemical, and mechanical properties of Pt and PtTi thin films deposited via thermionic vacuum arc (TVA) method on glass and silicon substrates. The deposited thin films were characterized by means of a scanning electron microscope technique (SEM). The quantitative elemental microanalysis was done using energy-dispersive X-ray spectroscopy (EDS). The tribological properties were studied by a ball-on-disc tribometer, and the mechanical properties were measured using nanoindentation tests. The roughness, as well as the micro and nanoscale features, were characterized using atomic force microscopy (AFM) and transmission electron microscopy (TEM). The wettability of the deposited Pt and PtTi thin films was investigated by the surface free energy evaluation (SFE) method. The purpose of our study was to prove the potential applications of Pt-based thin films in fields, such as nanoelectronics, fuel cells, medicine, and materials science.

scholarly journals Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications

Materials ◽  
2020 ◽  
Vol 13 (2) ◽  
pp. 399 ◽  
Author(s):  
Rodica Vladoiu ◽  
Aurelia Mandes ◽  
Virginia Dinca ◽  
Maria Balasoiu ◽  
Dmytro Soloviov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Lattice Parameter ◽  
Industrial Applications ◽  
Vacuum Arc ◽  
Average Roughness ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Cubic System ◽  
Gear Wheels ◽  
Thermionic Vacuum Arc

Titanium-based composites—titanium and silver (TiAg) and titanium and carbon (TiC)—were synthesized by the Thermionic Vacuum Arc (TVA) method on substrates especially for gear wheels and camshaft coating as mechanical components of irrigation pumps. The films were characterized by surface morphology, microstructure, and roughness through X-ray Diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Small-Angle Neutron Scattering (SANS). The silver (Ag) films crystallized into a cubic system with lattice a = 4.0833 Å at room temperature, indexed as cubic Ag group Fm3m. The crystallites were oriented in the [111] direction, and mean grain size was <D>111 = 265 Å. The TiC structure revealed a predominant cubic TiC phase, with a = 0.4098 as a lattice parameter determined by Cohen’s method. Average roughness (Ra) was 8 nm for the as-grown 170 nm thick TiAg film, and 1.8 nm for the as-grown 120 nm thick TiC film. Characteristic SANS contribution was detected from the TiAg layer deposited on a substrate of high-quality stainless steel with 0.45% carbon (OLC45) in the range of 0.015 Å−1 ≤ Q ≤ 0.4 Å−1, revealing the presence of sharp surfaces and an averaged triaxial ellipsoidal core-shell object.

scholarly journals Morphology, microstructure and magnetic properties of thermionic vacuum arc deposited NiFeCu ferromagnetic thin films

2012 ◽  
Vol 23 (1) ◽  
pp. 21-26
Author(s):  
Viorel Ionescu ◽  
Gabriel Prodan ◽  
Ionut Jepu ◽  
Ion Mustata ◽  
Cristian Petrica Lungu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Morphological Properties ◽  
Vacuum Arc ◽  
Spectroscopy Analysis ◽  
Kerr Rotation ◽  
Ferromagnetic Thin Films ◽  
Transmission Electron ◽  
Thermionic Vacuum Arc ◽  
Microstructure And Magnetic Properties

AbstractNiFeCo granular ferromagnetic thin films were deposited on glass and silicon wafer substrates in thermionic vacuum arc plasma with simultaneous ignition of plasma in Cu and NiFe vapors. The structural and morphological properties of the prepared films were investigated by TEM Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM). Elemental composition of the films was revealed after X-ray energy dispersive spectroscopy analysis (EDAX). The magneto-optical longitudinal Kerr rotation spectra of the samples were also measured and compared.

The electrical, elemental, optical, and surface properties of Si-doped ZnO thin films prepared by thermionic vacuum arc

2017 ◽  
Vol 4 (9) ◽  
pp. 096404 ◽  
Author(s):  
Reza Mohammadigharehbagh ◽  
Soner Özen ◽  
Hafizittin Hakan Yudar ◽  
Suat Pat ◽  
Şadan Korkmaz
Keyword(s):  
Thin Films ◽  
Surface Properties ◽  
Zno Thin Films ◽  
Vacuum Arc ◽  
Si Doped ◽  
Doped Zno ◽  
Thermionic Vacuum Arc

Optical, morphological and mechanical properties of an Al–Al2O3 nanocomposite thin film grown by thermionic vacuum arc

Optik ◽  
2016 ◽  
Vol 127 (6) ◽  
pp. 3383-3387 ◽  
Author(s):  
Volkan Şenay ◽  
Soner Özen ◽  
Suat Pat ◽  
Şadan Korkmaz
Keyword(s):  
Thin Film ◽  
Mechanical Properties ◽  
Vacuum Arc ◽  
Nanocomposite Thin Film ◽  
Thermionic Vacuum Arc

Determination of physical properties of graphene doped ZnO (ZnO:Gr) nanocomposite thin films deposited by a thermionic vacuum arc technique

2019 ◽  
Vol 557 ◽  
pp. 27-33 ◽  
Author(s):  
Saliha Elmas ◽  
Suat Pat ◽  
Reza Mohammadigharehbagh ◽  
Caner Musaoğlu ◽  
Mustafa Özgür ◽  
...  
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Vacuum Arc ◽  
Nanocomposite Thin Films ◽  
Doped Zno ◽  
Thermionic Vacuum Arc

scholarly journals Manipulation of MWCNT Concentration in MWCNT/TiO2Nanocomposite Thin Films for Dye-Sensitized Solar Cell

2014 ◽  
Vol 2014 ◽  
pp. 1-9 ◽  
Author(s):  
Huda Abdullah ◽  
Mohd Zikri Razali ◽  
Sahbudin Shaari ◽  
Mohd Raihan Taha
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Solar Cell ◽  
Short Circuit ◽  
Dye Sensitized Solar Cell ◽  
Multiwalled Carbon ◽  
Average Roughness ◽  
Tem Analysis ◽  
Dye Sensitized ◽  
Mwcnt Concentration

Dye-sensitized solar cell (DSSC) using multiwalled carbon nanotube/titanium dioxide (MWCNT/TiO2) was successfully synthesized using sol-gel method. In this method, it has been performed under various acid treatments MWCNT concentration level at (a) 0.00 g, (b) 0.01 g, (c) 0.02 g, and (d) 0.03 g. Atomic force microscopy (AFM) was used to study surface roughness of the MWCNT/TiO2thin films. The average roughness results for 0.00 g, 0.01 g, 0.02 g, and 0.03 g were 10.995, 18.308, 24.322, and 25.723 nm, respectively. High resolution transmission electron microscopy (HR-TEM) analysis showned the inner structural design of the MWCNT/TiO2particles. The TiO2nanoparticles covered almost all the area of MWCNT particles. Field emission scanning electron microscopy (FESEM) gave the morphological surface structure of the thin films. The thin films formed in good distribution with homogenous design. The DSSC with MWCNT/TiO2electrode containing 0.03 g MWCNT were resulted in the highest efficiency of 2.80% with short-circuit current densityJscof 9.42 mA/cm2and open-circuit voltageVocof 0.65 V.

Characterization of Pb-Doped GaN Thin Films Grown by Thermionic Vacuum Arc

2018 ◽  
Vol 47 (7) ◽  
pp. 3727-3732 ◽  
Author(s):  
Soner Özen ◽  
Suat Pat ◽  
Şadan Korkmaz
Keyword(s):  
Thin Films ◽  
Vacuum Arc ◽  
Thermionic Vacuum Arc
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