scholarly journals Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy

2013 ◽  
Vol 275 ◽  
pp. 19-22 ◽  
Author(s):  
D. Gracin ◽  
Z. Siketić ◽  
K. Juraić ◽  
M. Čeh
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
High Resolution Electron Microscopy ◽  
Nanocrystalline Silicon ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Silicon Thin Films ◽  
Detection Analysis ◽  
Resolution Electron

Elastic Recoil Detection Analysis of FeN thin films

2012 ◽  
Vol 70 (10) ◽  
pp. 2416-2420
Author(s):  
Renu Dhunna ◽  
I.P. Jain ◽  
Veena Sahajwalla
Keyword(s):  
Thin Films ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

ERDA analysis of ZnSx(OH)y thin films obtained by chemical bath deposition

2001 ◽  
Vol 668 ◽  
Author(s):  
Sven Neve ◽  
Wolfgang Bohne ◽  
Jörg Röhrich ◽  
Roland Scheer
Keyword(s):  
Thin Films ◽  
Chemical Bath Deposition ◽  
Zinc Acetate ◽  
Film Formation ◽  
Complexing Agents ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
High Ph ◽  
Elastic Recoil Detection ◽  
Detection Analysis

ABSTRACTThin films of Zn-compounds grown in a chemical bath have been studied by Elastic Recoil Detection Analysis (ERDA). The bath contained zinc acetate, thiourea and complexing agents such as ammonia and hydrazine. Large amounts of hydrogen and oxygen are detected within all samples. A strong effect of the pH of the solution is revealed: At high pH (>11.5) mainly ZnS growth takes place, while at lower pH Zn(OH)2 is the dominant product. Hence the pH of the solution can be used to adjust the film stoichiometry. Deposition of Zn-compound films is possible without ammonia in the solution while presence of hydroxide ions and hydrazine species is necessary. It is proposed that film formation takes place via a complex combining hydrazine and hydroxide ligands.

scholarly journals Compositional analysis of polycrystalline hafnium oxide thin films by heavy-ion elastic recoil detection analysis

2006 ◽  
Vol 515 (2) ◽  
pp. 695-699 ◽  
Author(s):  
F.L. Martínez ◽  
M. Toledano ◽  
E. San Andrés ◽  
I. Mártil ◽  
G. González-Díaz ◽  
...  
Keyword(s):  
Thin Films ◽  
Hafnium Oxide ◽  
Compositional Analysis ◽  
Heavy Ion ◽  
Elastic Recoil ◽  
Oxide Thin Films ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

Yttrium Oxyhydrides for Photochromic Applications: Correlating Composition and Optical Response

2018 ◽  
Author(s):  
Dmitrii Moldarev ◽  
Elbruz M. Baba ◽  
Marcos V. Moro ◽  
Chang C. You ◽  
Smagul Zh. Karazhanov ◽  
...  
Keyword(s):  
Medical Devices ◽  
Ternary Diagram ◽  
Optical And Electrical Properties ◽  
Ambient Conditions ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Photochromic Properties ◽  
Smart Windows ◽  
Elastic Recoil Detection ◽  
Detection Analysis

It has been recently demonstrated that yttrium oxyhydride(YHO) films can exhibit reversible photochromic properties when exposed to illumination at ambient conditions. This switchable optical propertyenables their utilization in many technological applications, such as smart windows, sensors, goggles, medical devices, etc. However, how the composition of the films affects their optical properties is not fully clear and therefore demands a straightforward investigation. In this work, the composition of YHO films manufactured by reactive magnetron sputtering under different conditions is deduced in a ternary diagram from Time-of-Flight Elastic Recoil Detection Analysis (ToF-ERDA). The results suggest that stable compounds are formed with a specificchemical formula – YH<sub>2-δ</sub>O<sub>δ</sub>. In addition, optical and electrical properties of the films are investigated, and a correlation with their compositions is established. The corresponding photochromic response is found in a specific oxygen concentration range (0.45 < δ < 1.5) with maximum and minimum of magnitude on the lower and higher border, respectively.

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