Accurate depth profiling of dry oxidized SiGeC thin films by extended Full Spectrum ToF-SIMS

2011 ◽  
Vol 257 (22) ◽  
pp. 9414-9419 ◽  
Author(s):  
M. Py ◽  
E. Saracco ◽  
J.F. Damlencourt ◽  
J.P. Barnes ◽  
J.M. Fabbri ◽  
...  
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Full Spectrum ◽  
Tof Sims

Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling

2015 ◽  
Vol 47 (10) ◽  
pp. 953-960 ◽  
Author(s):  
Xianwen Ren ◽  
Lu-Tao Weng ◽  
Yi Fu ◽  
Kai-Mo Ng ◽  
Chi-Ming Chan
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Depth Profiling ◽  
Tof Sims ◽  
Chain Conformations ◽  
Sims Depth Profiling

scholarly journals Effect of the molecular weight on the depth profiling of PMMA thin films using low‐energy Cs + sputtering

2021 ◽  
Author(s):  
Amal Ben Hadj Mabrouk ◽  
Christophe Licitra ◽  
Antoine Chateauminois ◽  
Marc Veillerot
Keyword(s):  
Thin Films ◽  
Molecular Weight ◽  
Depth Profiling ◽  
Low Energy

scholarly journals Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling

2021 ◽  
Vol 27 (S1) ◽  
pp. 1564-1565
Author(s):  
Vincent Smentkowski ◽  
Shubhodeep Goswami ◽  
Felix Kollmer ◽  
Julia Zakel ◽  
Henrik Arlinghaus ◽  
...  
Keyword(s):  
Thin Film ◽  
Depth Profiling ◽  
Tof Sims

Depth profiling of layered structures in conducting polymer thin films prepared by the potential-programmed electropolymerization method

1991 ◽  
Vol 205 (2) ◽  
pp. 258-265 ◽  
Author(s):  
Tomakazu Iyoda ◽  
Hideo Toyoda ◽  
Mamoru Fujitsuka ◽  
Reiko Nakahara ◽  
Kenichi Honda ◽  
...  
Keyword(s):  
Thin Films ◽  
Conducting Polymer ◽  
Polymer Thin Films ◽  
Depth Profiling ◽  
Layered Structures
Sign in / Sign up

Export Citation Format

Share Document