SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ions

2008 ◽  
Vol 255 (4) ◽  
pp. 1423-1426 ◽  
Author(s):  
O. Koudriavtseva ◽  
A. Morales-Acevedo ◽  
Yu. Kudriavtsev ◽  
S. Gallardo ◽  
R. Asomoza ◽  
...  
Keyword(s):  
Solar Cells ◽  
Depth Profiling ◽  
Cluster Ions ◽  
Profiling Analysis ◽  
Sims Depth Profiling

SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell

2014 ◽  
Vol 46 (S1) ◽  
pp. 341-343
Author(s):  
Tae Woon Kim ◽  
Hyun Jeong Baek ◽  
Jong Shik Jang ◽  
Seung Mi Lee ◽  
Kyung Joong Kim
Keyword(s):  
Solar Cell ◽  
Depth Profiling ◽  
Profiling Analysis ◽  
Sims Depth Profiling

Characterization of polymer solar cells by TOF-SIMS depth profiling

2003 ◽  
Vol 203-204 ◽  
pp. 547-550 ◽  
Author(s):  
C.W.T. Bulle-Lieuwma ◽  
W.J.H. van Gennip ◽  
J.K.J. van Duren ◽  
P. Jonkheijm ◽  
R.A.J. Janssen ◽  
...  
Keyword(s):  
Solar Cells ◽  
Polymer Solar Cells ◽  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling

Secondary cluster ions Ge 2 − and Ge 3 − for improving depth resolution of SIMS depth profiling of GeSi/Si heterostructures

2010 ◽  
Vol 44 (3) ◽  
pp. 401-404 ◽  
Author(s):  
M. N. Drozdov ◽  
Yu. N. Drozdov ◽  
D. N. Lobanov ◽  
A. V. Novikov ◽  
D. V. Yurasov
Keyword(s):  
Depth Profiling ◽  
Depth Resolution ◽  
Cluster Ions ◽  
Secondary Cluster ◽  
Sims Depth Profiling

Characterization of polymeric light emitting diodes by SIMS depth profiling analysis

1995 ◽  
Vol 353 (5-8) ◽  
pp. 642-646 ◽  
Author(s):  
G. Sauer ◽  
M. Kilo ◽  
M. Hund ◽  
A. Wokaun ◽  
S. Karg ◽  
...  
Keyword(s):  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Light Emitting ◽  
Profiling Analysis ◽  
Sims Depth Profiling

Depth-profiling analysis of MOCVD-grown triple junction solar cells by SIMS

2010 ◽  
Vol 43 (1-2) ◽  
pp. 646-648 ◽  
Author(s):  
Helena Téllez ◽  
José M. Vadillo ◽  
Egbert Rodríguez Messmer ◽  
Javier Miguel-Sánchez ◽  
J. Javier Laserna
Keyword(s):  
Solar Cells ◽  
Triple Junction ◽  
Depth Profiling ◽  
Profiling Analysis

scholarly journals Low Damage Etching and SIMS Depth Profiling with Large Ar Cluster Ions

2008 ◽  
Vol 33 (4) ◽  
pp. 1043-1046
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Yoshiro Honda ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Cluster Ions ◽  
Sims Depth Profiling

SIMS depth profiling of CdTe-based solar cells grown on sapphire substrates

2006 ◽  
Vol 511-512 ◽  
pp. 66-70 ◽  
Author(s):  
M. Emziane ◽  
K. Durose ◽  
D.P. Halliday ◽  
N. Romeo ◽  
A. Bosio
Keyword(s):  
Solar Cells ◽  
Depth Profiling ◽  
Sapphire Substrates ◽  
Sims Depth Profiling
Sign in / Sign up

Export Citation Format

Share Document