Quantitative ToF-SIMS depth profiling of a multi-phased III-V semiconductor matrix via the analysis of secondary cluster ions

2016 ◽  
Vol 48 (7) ◽  
pp. 422-427 ◽  
Author(s):  
Bin Gong ◽  
Christopher E. Marjo
Keyword(s):  
Depth Profiling ◽  
Cluster Ions ◽  
Tof Sims ◽  
Secondary Cluster ◽  
Semiconductor Matrix ◽  
Sims Depth Profiling

Secondary cluster ions Ge 2 − and Ge 3 − for improving depth resolution of SIMS depth profiling of GeSi/Si heterostructures

2010 ◽  
Vol 44 (3) ◽  
pp. 401-404 ◽  
Author(s):  
M. N. Drozdov ◽  
Yu. N. Drozdov ◽  
D. N. Lobanov ◽  
A. V. Novikov ◽  
D. V. Yurasov
Keyword(s):  
Depth Profiling ◽  
Depth Resolution ◽  
Cluster Ions ◽  
Secondary Cluster ◽  
Sims Depth Profiling

Large O2 Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO2 Films

2017 ◽  
Vol 89 (4) ◽  
pp. 2377-2382 ◽  
Author(s):  
Sabine Holzer ◽  
Stefan Krivec ◽  
Sven Kayser ◽  
Julia Zakel ◽  
Herbert Hutter
Keyword(s):  
Alkali Metals ◽  
Depth Profiling ◽  
Cluster Ions ◽  
Sio2 Films ◽  
Tof Sims ◽  
Sims Depth Profiling

TOF-SIMS depth profiling of SIMON

2003 ◽  
Vol 203-204 ◽  
pp. 441-444
Author(s):  
Ge Xin ◽  
Gui Dong ◽  
Chen Xu ◽  
Cha Liangzhen ◽  
O. Brox ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 190-193 ◽  
Author(s):  
Nimer Wehbe ◽  
Laurent Houssiau
Keyword(s):  
Vitamin C ◽  
Depth Profiling ◽  
Ion Beams ◽  
Tof Sims ◽  
Sims Depth Profiling

TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

2008 ◽  
Vol 393 (8) ◽  
pp. 1857-1861 ◽  
Author(s):  
J. Schnöller ◽  
R. Franz ◽  
C. Mitterer ◽  
H. Hutter
Keyword(s):  
Depth Profiling ◽  
Hard Coatings ◽  
Tof Sims ◽  
Sims Depth Profiling ◽  
Element Mapping

scholarly journals ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts

2012 ◽  
Vol 84 (11) ◽  
pp. 4880-4885 ◽  
Author(s):  
Michael A. Robinson ◽  
Daniel J. Graham ◽  
David G. Castner
Keyword(s):  
3D Imaging ◽  
Depth Profiling ◽  
3T3 Fibroblasts ◽  
Tof Sims ◽  
Nih 3T3 ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy

2004 ◽  
Vol 231-232 ◽  
pp. 850-853 ◽  
Author(s):  
J. Engkvist ◽  
U. Bexell ◽  
T.M. Grehk ◽  
M. Olsson
Keyword(s):  
High Temperature ◽  
Depth Profiling ◽  
Alumina Scales ◽  
High Temperature Alloy ◽  
Tof Sims ◽  
Sims Depth Profiling

TOF-SIMS depth profiling study of corrosion propagation in coated hollow spheres

2006 ◽  
Vol 38 (4) ◽  
pp. 833-837 ◽  
Author(s):  
Renáta Oriňáková ◽  
Andrej Oriňák ◽  
Heinrich F. Arlinghaus ◽  
Sebastian Hellweg ◽  
Miriam Kupková ◽  
...  
Keyword(s):  
Hollow Spheres ◽  
Depth Profiling ◽  
Corrosion Propagation ◽  
Tof Sims ◽  
Sims Depth Profiling
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