Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidation

J. Kovač; M. Bizjak; B. Praček; A. Zalar

doi:10.1016/j.apsusc.2006.09.014

Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidation

Applied Surface Science ◽

10.1016/j.apsusc.2006.09.014 ◽

2007 ◽

Vol 253 (9) ◽

pp. 4132-4136

Author(s):

J. Kovač ◽

M. Bizjak ◽

B. Praček ◽

A. Zalar

Keyword(s):

Low Temperature ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Low Temperature Oxidation ◽

Temperature Oxidation ◽

Fe Oxide ◽

Oxide Layers ◽

Auger Electron Spectroscopy Depth

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Low Temperature Oxidation of Silicon Studied by Photosensitive ESR and Auger Electron Spectroscopy

Journal of The Electrochemical Society ◽

10.1149/1.2132758 ◽

1976 ◽

Vol 123 (1) ◽

pp. 26-29 ◽

Cited By ~ 19

Author(s):

Jerzy Rużyłło ◽

Ikuo Shiota ◽

Nobuo Miyamoto ◽

Jun‐ichi Nishizawa

Keyword(s):

Low Temperature ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Temperature Oxidation ◽

Temperature Oxidation

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ChemInform Abstract: LOW TEMPERATURE OXIDATION OF SILICON STUDIED BY PHOTOSENSITIVE ESR AND AUGER ELECTRON SPECTROSCOPY

Chemischer Informationsdienst ◽

10.1002/chin.197616019 ◽

1976 ◽

Vol 7 (16) ◽

pp. no-no

Author(s):

JERZY RUZYLLO ◽

IKUO SHIOTA ◽

NOBUO MIYAMOTO ◽

JUN-ICHI NISHIZAWA

Keyword(s):

Low Temperature ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Temperature Oxidation ◽

Temperature Oxidation

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Characterization of oxide layers on amorphous Mg-based alloys by Auger electron spectroscopy with sputter depth profiling

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-003-1787-3 ◽

2003 ◽

Vol 375 (7) ◽

pp. 896-901 ◽

Cited By ~ 3

Author(s):

S. Baunack ◽

R. V. Subba Rao ◽

U. Wolff

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Oxide Layers

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Determination of the relative sputtering yield of carbon to tantalum by means of Auger electron spectroscopy depth profiling

Surface and Interface Analysis ◽

10.1002/sia.3101 ◽

2009 ◽

Vol 41 (10) ◽

pp. 799-803 ◽

Cited By ~ 9

Author(s):

L. Kotis ◽

M. Menyhard ◽

A. Sulyok ◽

G. Sáfrán ◽

A. Zalar ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Auger Electron Spectroscopy Depth ◽

Sputtering Yield

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Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling

Applied Surface Science ◽

10.1016/j.apsusc.2005.02.026 ◽

2005 ◽

Vol 252 (1) ◽

pp. 162-166 ◽

Cited By ~ 25

Author(s):

S. Baunack ◽

U. Kamachi Mudali ◽

A. Gebert

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Oxide Layers

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Sample rotating in Auger electron spectroscopy depth profiling

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574242 ◽

1987 ◽

Vol 5 (5) ◽

pp. 2979-2980 ◽

Cited By ~ 10

Author(s):

A. Zalar

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Auger Electron Spectroscopy Depth

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Auger electron spectroscopy depth profiling during sample rotation

Surface and Interface Analysis ◽

10.1002/sia.740090108 ◽

1986 ◽

Vol 9 (1) ◽

pp. 41-46 ◽

Cited By ~ 52

Author(s):

A. Zalar

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Sample Rotation ◽

Auger Electron Spectroscopy Depth

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Study of ion mixing during Auger electron spectroscopy depth profiling of Ge–Si multilayer system

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579216 ◽

1994 ◽

Vol 12 (4) ◽

pp. 2368-2372 ◽

Cited By ~ 7

Author(s):

M. Menyhard ◽

A. Barna ◽

J. P. Biersack

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Multilayer System ◽

Auger Electron Spectroscopy Depth

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Improved depth resolution by sample rotation during Auger electron spectroscopy depth profiling

Thin Solid Films ◽

10.1016/0040-6090(85)90269-x ◽

1985 ◽

Vol 124 (3-4) ◽

pp. 223-230 ◽

Cited By ~ 212

Author(s):

A Zalar

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Depth Resolution ◽

Sample Rotation ◽

Auger Electron Spectroscopy Depth

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Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling

Applied Surface Science ◽

10.1016/j.apsusc.2014.08.019 ◽

2014 ◽

Vol 316 ◽

pp. 301-307 ◽

Cited By ~ 4

Author(s):

L. Kotis ◽

S. Gurban ◽

B. Pecz ◽

M. Menyhard ◽

R. Yakimova

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Graphene Layer ◽

Thickness Distribution ◽

Depth Profiling ◽

Auger Electron Spectroscopy Depth ◽

Sic Wafer

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