Crystallization process of high-k gate dielectrics studied by surface X-ray diffraction
2005 ◽
Vol 244
(1-4)
◽
pp. 16-20
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2007 ◽
Vol 130
◽
pp. 171-174
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2005 ◽
Vol 244
(1-4)
◽
pp. 281-284
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Keyword(s):
1997 ◽
Vol 12
(4)
◽
pp. 1131-1140
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Exploring concomitant/conformational dimorphism in a difluoro-substituted phosphoramidate derivative
2019 ◽
Vol 75
(4)
◽
pp. 451-461
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