ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

2004 ◽  
Vol 231-232 ◽  
pp. 289-295 ◽  
Author(s):  
L. Kailas ◽  
J.-N. Audinot ◽  
H.-N. Migeon ◽  
P. Bertrand
Keyword(s):  
Thin Films ◽  
Molecular Characterization ◽  
Domain Formation ◽  
Tof Sims

Effects of domain formation on the dielectric properties of ferroelectric thin films

2001 ◽  
Vol 32 (1-4) ◽  
pp. 235-249 ◽  
Author(s):  
N. A. Pertsev ◽  
V. G. Koukhar ◽  
R. Waser ◽  
S. Hoffmann
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Ferroelectric Thin Films ◽  
Domain Formation

Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD–PEEM

2007 ◽  
Vol 601 (20) ◽  
pp. 4690-4693 ◽  
Author(s):  
Toshiyuki Taniuchi ◽  
Ryutaro Yasuhara ◽  
Hiroshi Kumigashira ◽  
Masato Kubota ◽  
Hiroyuki Okazaki ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Domain ◽  
Thickness Dependence ◽  
Epitaxial Thin Films ◽  
Domain Formation

Domain formation in thin films of a thermotropic copolymer

1990 ◽  
Vol 9 (8) ◽  
pp. 935-936 ◽  
Author(s):  
A. Anwer ◽  
R. J. Spontak ◽  
A. H. Windle
Keyword(s):  
Thin Films ◽  
Domain Formation

Critical thickness for stripe domain formation in FePt thin films: Dependence on residual stress

2016 ◽  
Vol 119 (8) ◽  
pp. 083906 ◽  
Author(s):  
N. R. Álvarez ◽  
J. E. Gómez ◽  
A. E. Moya Riffo ◽  
M. A. Vicente Álvarez ◽  
A. Butera
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Critical Thickness ◽  
Domain Formation ◽  
Stripe Domain ◽  
Fept Thin Films
Sign in / Sign up

Export Citation Format

Share Document