Measurement uncertainty distributions and uncertainty propagation by the simulation approach

2001 ◽  
Vol 6 (8) ◽  
pp. 352-359 ◽  
Author(s):  
P. Tarapčík ◽  
Ján Labuda ◽  
Blandine Fourest ◽  
Viliam Pätoprstý
Keyword(s):  
Measurement Uncertainty ◽  
Uncertainty Propagation ◽  
Simulation Approach

scholarly journals Evaluating uncertainty of some radiation measurand using Monte Carlo method

2021 ◽  
Vol 9 (4) ◽  
pp. 34-40
Author(s):  
Duc Ky Bui ◽  
Ngoc Quynh Nguyen ◽  
Duc Thang Duong ◽  
Ngoc Thiem Le ◽  
Quang Tuan Ho ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Method ◽  
Ionizing Radiation ◽  
Measurement Uncertainty ◽  
Physical Quantity ◽  
Uncertainty Propagation ◽  
Dose Equivalent ◽  
Air Kerma ◽  
Mandatory Requirement ◽  
Radiation Measurements

Evaluating measurement uncertainty of a physical quantity is a mandatory requirement for laboratories within the recognition ISO/IEC 17025 certification to access reliability of measured results. In this work, the uncertainty of ionizing radiation measurements such as air-kerma, personal dose equivalent Hp(d) was evaluated based on GUM method and Monte Carlo method. An uncertainty propagation software has been developed for evaluation of the measurement uncertainty more convenient.

scholarly journals Measurement Uncertainty Propagation through Basic Photovoltaic Cell Models

Energies ◽  
2019 ◽  
Vol 12 (6) ◽  
pp. 1029 ◽  
Author(s):  
Ivan Tolić ◽  
Mario Primorac ◽  
Kruno Miličević
Keyword(s):  
Measurement Uncertainty ◽  
Fill Factor ◽  
Short Circuit ◽  
Renewable Energy Sources ◽  
Uncertainty Propagation ◽  
Short Circuit Current ◽  
Photovoltaic Cell ◽  
Open Circuit ◽  
Cell Models ◽  
Global Irradiance

This paper presents measurement uncertainty propagation through four basic photovoltaic cell models: One-diode model without resistances, with one resistance and with two resistances and two-diode model with two resistances. The expressions for the output current of all photovoltaic cell models is presented as a function of global irradiance G and temperature T. Next, the expressions for all fill factor parameters: short-circuit current, open-circuit voltage, current and voltage at the maximum power point, depending on the global irradiance G and temperature T are derived as well. For each parameter, Monte Carlo simulations to calculate the measurement uncertainty of the parameter are performed and the results were used as input values for the calculation of measurement uncertainty of fill factor. Practical calculations are performed in laboratory for renewable energy sources located on 45°32′ N and 18°44′ E. Final fill factor calculations are compared for three different module technologies.

Uncertainty Analysis for Fiber Permeability Measurement

2005 ◽  
Vol 127 (4) ◽  
pp. 907-911 ◽  
Author(s):  
Chensong Dong
Keyword(s):  
Measurement Uncertainty ◽  
Uncertainty Propagation ◽  
Permeability Measurement ◽  
Parameter Uncertainties ◽  
Factors Affecting ◽  
Sources Of Uncertainty ◽  
Measurement Results ◽  
Simulation Results ◽  
Instrument Accuracy ◽  
Significant Factors

An uncertainty study for fiber permeability measurement is presented in this paper. The sources of uncertainty were identified. This paper focuses on the instrument and environmental uncertainties. The parameter uncertainties of both unsaturated and saturated measurements were estimated based on instrument accuracy limitations and environmental influences. Their influences on the permeability uncertainty were investigated by uncertainty propagation and Monte Carlo simulation. The significant factors affecting the permeability measurement uncertainty were identified. The results show that (1) unsaturated measurement has a higher accuracy than saturated measurement; (2) the significant factors affecting measurement results are pressure and viscosity. Based on the simulation results, the approaches to reduce measurement uncertainty were proposed.

Uncertainty Evaluation of SEM-Based Nanoroughness Measurement

2012 ◽  
Vol 472-475 ◽  
pp. 1319-1322
Author(s):  
Feng Xia Zhao ◽  
Qing Hai Wang ◽  
Lin Na Zhang ◽  
Peng Zheng
Keyword(s):  
Measurement Uncertainty ◽  
Evaluation Model ◽  
Uncertainty Propagation ◽  
Propagation Model ◽  
Uncertainty Evaluation ◽  
Line Edge Roughness ◽  
Geometric Product ◽  
Edge Roughness ◽  
Product Specification

In metrology, a measurement process without uncertainty evaluation is incomplete. The same applies to nanoroughness metrology. In this paper, Scanning Electron Microscopy (SEM） measurement uncertainty of nanoroughness is studied based on ISO Geometric Product Specification and Verification (GPS). The uncertainty propagation model of SEM-based nanoroughness measurement is presented. The evaluation model of SEM-based standard measurement uncertainty is conducted. As a case study, the line edge roughness uncertainty produced by the JSM-6700F SEM is evaluated.

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