Chemical Interactions by Low-Energy Electron-Induced X-Ray Emission Spectroscopy, LEXES

Christiane Bonnelle

doi:10.1007/s006040200031

Chemical Interactions by Low-Energy Electron-Induced X-Ray Emission Spectroscopy, LEXES

Microchimica Acta ◽

10.1007/s006040200031 ◽

2002 ◽

Vol 138 (3-4) ◽

pp. 275-282

Author(s):

Christiane Bonnelle

Keyword(s):

Emission Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Chemical Interactions ◽

X Ray ◽

Low Energy Electron

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Shallow As dose measurements of patterned wafers with secondary ion mass spectrometry and low energy electron induced x-ray emission spectroscopy

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3253352 ◽

2010 ◽

Vol 28 (1) ◽

pp. C1C54-C1C58 ◽

Cited By ~ 3

Author(s):

H.-U. Ehrke ◽

N. Loibl ◽

M. P. Moret ◽

F. Horréard ◽

J. Choi ◽

...

Keyword(s):

Mass Spectrometry ◽

Emission Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Patterned Wafers ◽

Low Energy Electron ◽

Dose Measurements ◽

Secondary Ion

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A low-energy electron microscopy and x-ray photo-emission electron microscopy study of Li intercalated into graphene on SiC(0001)

New Journal of Physics ◽

10.1088/1367-2630/12/12/125015 ◽

2010 ◽

Vol 12 (12) ◽

pp. 125015 ◽

Cited By ~ 38

Author(s):

C Virojanadara ◽

A A Zakharov ◽

S Watcharinyanon ◽

R Yakimova ◽

L I Johansson

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Emission Electron ◽

Low Energy Electron

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Structures of sulfur on TiO2() determined by scanning tunneling microscopy, X-ray photoelectron spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/s0039-6028(00)00849-9 ◽

2001 ◽

Vol 470 (3) ◽

pp. 347-360 ◽

Cited By ~ 56

Author(s):

E.L.D. Hebenstreit ◽

W. Hebenstreit ◽

U. Diebold

Keyword(s):

Electron Diffraction ◽

Scanning Tunneling Microscopy ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.070103 ◽

2011 ◽

Vol 50 (7) ◽

pp. 070103 ◽

Cited By ~ 9

Author(s):

Ryota Takahashi ◽

Hiroyuki Handa ◽

Shunsuke Abe ◽

Kei Imaizumi ◽

Hirokazu Fukidome ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

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X-ray Photoemission and Low-Energy Electron Microscope

Nanoscale Spectroscopy and Its Applications to Semiconductor Research - Lecture Notes in Physics ◽

10.1007/3-540-45850-6_15 ◽

2002 ◽

pp. 172-179 ◽

Cited By ~ 1

Author(s):

R. Vašina ◽

M. Mynář ◽

V. Kolařík

Keyword(s):

Electron Microscope ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron

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X-ray and Low Energy Electron Induced Damage in Alkanethiolate Monolayers on Au-substrates

Zeitschrift für Physikalische Chemie ◽

10.1524/zpch.1997.202.part_1_2.263 ◽

1997 ◽

Vol 202 (Part_1_2) ◽

pp. 263-272 ◽

Cited By ~ 82

Author(s):

B. Jäger ◽

H. Schürmann ◽

H. U. Müller ◽

H.-J. Himmel ◽

M. Neumann ◽

...

Keyword(s):

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron

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Optical emission spectroscopy study of the influence of the low-energy electron beam parameters on the content of neutral atomic nitrogen in the beam plasma

Journal of Physics Conference Series ◽

10.1088/1742-6596/1115/3/032010 ◽

2018 ◽

Vol 1115 ◽

pp. 032010 ◽

Cited By ~ 1

Author(s):

A I Menshakov ◽

Yu S Surkov ◽

V I Solomonov ◽

N V Gavrilov

Keyword(s):

Electron Beam ◽

Emission Spectroscopy ◽

Optical Emission Spectroscopy ◽

Optical Emission ◽

Low Energy ◽

Energy Electron ◽

Atomic Nitrogen ◽

Spectroscopy Study ◽

Low Energy Electron ◽

Beam Parameters

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Investigations of L-shell x-ray production cross sections of In and Sn by low-energy electron impact

Journal of Physics B Atomic Molecular and Optical Physics ◽

10.1088/0953-4075/49/6/065205 ◽

2016 ◽

Vol 49 (6) ◽

pp. 065205 ◽

Cited By ~ 6

Author(s):

J L Zhao ◽

Z An ◽

J J Zhu ◽

W J Tan ◽

M T Liu

Keyword(s):

Electron Impact ◽

Cross Sections ◽

Production Cross ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron

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Molecular surface analysis using low energy electron-induced X-ray emission spectrometry (LEEIXS): A quantitative approach

Surface and Interface Analysis ◽

10.1002/sia.740120225 ◽

1988 ◽

Vol 12 (2) ◽

pp. 171-171

Author(s):

F. Gaillard ◽

M. Romand

Keyword(s):

Surface Analysis ◽

Low Energy ◽

Quantitative Approach ◽

Energy Electron ◽

Molecular Surface ◽

Emission Spectrometry ◽

X Ray ◽

Low Energy Electron

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Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

Applied Physics Letters ◽

10.1063/1.4905651 ◽

2015 ◽

Vol 106 (2) ◽

pp. 021602 ◽

Cited By ~ 18

Author(s):

O. Romanyuk ◽

S. Fernández-Garrido ◽

P. Jiříček ◽

I. Bartoš ◽

L. Geelhaar ◽

...

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Gan Nanowire ◽

Non Destructive

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