Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

O. Romanyuk; S. Fernández-Garrido; P. Jiříček; I. Bartoš; L. Geelhaar; O. Brandt; T. Paskova

doi:10.1063/1.4905651

Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

Applied Physics Letters ◽

10.1063/1.4905651 ◽

2015 ◽

Vol 106 (2) ◽

pp. 021602 ◽

Cited By ~ 18

Author(s):

O. Romanyuk ◽

S. Fernández-Garrido ◽

P. Jiříček ◽

I. Bartoš ◽

L. Geelhaar ◽

...

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Gan Nanowire ◽

Non Destructive

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X-ray photoelectron diffraction and low-energy electron diffraction study of the interaction of oxygen with the Ni(001) surface: c(2 × 2) to saturated oxide

Surface Science ◽

10.1016/0039-6028(93)90608-m ◽

1993 ◽

Vol 282 (1-2) ◽

pp. 33-61 ◽

Cited By ~ 72

Author(s):

R.S. Saiki ◽

A.P. Kaduwela ◽

M. Sagurton ◽

J. Osterwalder ◽

D.J. Friedman ◽

...

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Electron Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage

Surface Science Letters ◽

10.1016/0167-2584(91)91192-y ◽

1991 ◽

Vol 256 (3) ◽

pp. A543

Author(s):

T. Abukawa ◽

T. Okane ◽

S. Kono

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Structure of a non-bulk termination of the clean Pt3Sn(111) surface: a study by low-energy electron diffraction and X-ray photoelectron diffraction

Journal of Physics Condensed Matter ◽

10.1088/0953-8984/5/14/003 ◽

1993 ◽

Vol 5 (14) ◽

pp. L207-L212 ◽

Cited By ~ 21

Author(s):

A Atrei ◽

U Bardi ◽

M Torrini ◽

E Zanazzi ◽

G Rovida ◽

...

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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X-ray photoelectron diffraction and low-energy electron diffraction study of the interaction of oxygen with the Ni(001) surface: c(2 × 2) to saturated oxide

Surface Science Letters ◽

10.1016/0167-2584(93)91255-m ◽

1993 ◽

Vol 282 (1-2) ◽

pp. A198 ◽

Cited By ~ 1

Author(s):

R.S. Saiki ◽

A.P. Kaduwela ◽

M. Sagurton ◽

J. Osterwalder ◽

D.J. Friedman ◽

...

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Electron Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Surface alloy formation and interdiffusion in : a combined low-energy electron diffraction and X-ray photoelectron diffraction study

Surface Science ◽

10.1016/s0039-6028(96)01187-9 ◽

1997 ◽

Vol 374 (1-3) ◽

pp. 104-116 ◽

Cited By ~ 15

Author(s):

R. Fasel ◽

M. Gierer ◽

H. Bludau ◽

P. Aebi ◽

J. Osterwalder ◽

...

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Low Energy ◽

Surface Alloy ◽

Energy Electron ◽

Alloy Formation ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage

Surface Science ◽

10.1016/0039-6028(91)90879-w ◽

1991 ◽

Vol 256 (3) ◽

pp. 370-378 ◽

Cited By ~ 44

Author(s):

T. Abukawa ◽

T. Okane ◽

S. Kono

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Photoelectron diffraction intensity calculation by using tensor low-energy electron diffraction theory

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581861 ◽

1999 ◽

Vol 17 (4) ◽

pp. 1621-1625 ◽

Cited By ~ 2

Author(s):

Shinji Omori ◽

Yoshimasa Nihei

Keyword(s):

Electron Diffraction ◽

Diffraction Theory ◽

Low Energy ◽

Energy Electron ◽

Diffraction Intensity ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Intensity Calculation

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Structures of sulfur on TiO2() determined by scanning tunneling microscopy, X-ray photoelectron spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/s0039-6028(00)00849-9 ◽

2001 ◽

Vol 470 (3) ◽

pp. 347-360 ◽

Cited By ~ 56

Author(s):

E.L.D. Hebenstreit ◽

W. Hebenstreit ◽

U. Diebold

Keyword(s):

Electron Diffraction ◽

Scanning Tunneling Microscopy ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.070103 ◽

2011 ◽

Vol 50 (7) ◽

pp. 070103 ◽

Cited By ~ 9

Author(s):

Ryota Takahashi ◽

Hiroyuki Handa ◽

Shunsuke Abe ◽

Kei Imaizumi ◽

Hirokazu Fukidome ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

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InSb–CdTe interfaces: A combined study by soft x-ray photoemission, low-energy electron diffraction, and Raman spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.583719 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1233 ◽

Cited By ~ 28

Author(s):

K. J. Mackey

Keyword(s):

Raman Spectroscopy ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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