Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever

2001 ◽  
Vol 72 (S1) ◽  
pp. S97-S100 ◽  
Author(s):  
K. Kobayashi ◽  
H. Yamada ◽  
K. Umeda ◽  
T. Horiuchi ◽  
S. Watanabe ◽  
...  
Keyword(s):  
Surface Potential ◽  
Ultrathin Film ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy ◽  
Piezoelectric Cantilever

Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4381-4383 ◽  
Author(s):  
Keiichi Umeda ◽  
Kei Kobayashi ◽  
Kenji Ishida ◽  
Shu Hotta ◽  
Hirofumi Yamada ◽  
...  
Keyword(s):  
Surface Potential ◽  
Ultrathin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

Surface Potential Measurement of Carbon Nanotube Field-Effect Transistors Using Kelvin Probe Force Microscopy

2007 ◽  
Vol 46 (4B) ◽  
pp. 2496-2500 ◽  
Author(s):  
Takeo Umesaka ◽  
Hirofumi Ohnaka ◽  
Yutaka Ohno ◽  
Shigeru Kishimoto ◽  
Koichi Maezawa ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Surface Potential ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy
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