scholarly journals Scanning force microscopy on heavy-ion tracks in muscovite mica: track diameter versus energy loss and loading force

1998 ◽  
Vol 66 (7) ◽  
pp. S1151-S1154 ◽  
Author(s):  
J. Ackermann ◽  
A. Müller ◽  
R. Neumann ◽  
Y. Wang
Keyword(s):  
Energy Loss ◽  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Muscovite Mica ◽  
Scanning Force ◽  
Track Diameter

Scanning force microscopy of heavy-ion tracks

1993 ◽  
Vol 126 (1-4) ◽  
pp. 213-216 ◽  
Author(s):  
J. Ackermann ◽  
S. Grafström ◽  
M. Neitzert ◽  
R. Neumann ◽  
C. Trautmann ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Scanning Force

Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum

1997 ◽  
pp. 261-267 ◽  
Author(s):  
J. Ackermann ◽  
S. Grafström ◽  
T. Hagen ◽  
J. Kowalski ◽  
R. Neumann ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Scanning Force

Scanning force microscope Z-calibration using steps on chemically etched mica

1995 ◽  
Vol 53 ◽  
pp. 204-205
Author(s):  
L. Fei ◽  
P. Fraundorf
Keyword(s):  
Lattice Spacing ◽  
Scanning Force Microscopy ◽  
Calibration Standard ◽  
Scanning Force Microscope ◽  
Calibration Standards ◽  
Gold Particles ◽  
Force Microscopy ◽  
Muscovite Mica ◽  
Scanning Force ◽  
Size Variability

Obtaining reliable dimensional information in all three directions is very important in scanning force microscopy (SFM). Calibration standards for SFM should be easy to produce and reliable. For example, mica is often used as a lateral calibration standard, because lattice fringes are relatively easy to obtain. However, reliable height information is hard to get. Pits formed by lithography (180 nm in depth) are used for vertical calibration by some SFM manufacturers.1 These standards have 10variability and are large on the size scale of monolayers. Colloidal gold particles have been proposed as one kind of SFM vertical standard, but the size variability of these particles (e.g. ranging from 5 to 24 nm) makes their use of limited practical value.One solution to the problem is to use chemically etched mica as height calibration standard. Mica has a layered structure, and its c-axis is well denned and weakly bonded. In this study, we used muscovite mica which has c-axis lattice spacing of 10 Å.

Heavy-ion induced defects in phlogopite imaged by scanning force microscopy

2002 ◽  
Vol 158-159 ◽  
pp. 439-443 ◽  
Author(s):  
M Lang ◽  
U.A Glasmacher ◽  
B Moine ◽  
C Müller ◽  
R Neumann ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Scanning Force ◽  
Induced Defects
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