Electric field effect and atomic manipulation process with the probe tip of a scanning tunneling microscope
2008 ◽
Vol 112
(15)
◽
pp. 4731-4734
◽
2020 ◽
Vol 22
(11)
◽
pp. 6370-6375
◽
1997 ◽
Vol 15
(4)
◽
pp. 1437
◽
1995 ◽
Vol 34
(Part 1, No. 6B)
◽
pp. 3373-3375
◽
1994 ◽
Vol 12
(3)
◽
pp. 2164
◽
1994 ◽
Vol 12
(6)
◽
pp. 3731
◽
2005 ◽
pp. 49-64