Atomic Force Microscopy/Scanning Tunneling Microscopy 3
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Published By Kluwer Academic Publishers

0306462974
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains

2005 ◽  
pp. 181-188
Author(s):  
J. Romstedt ◽  
H. Arends ◽  
R. Schmidt ◽  
W. Riedler ◽  
K. Torkar ◽  
...  
Keyword(s):  
In Situ Analysis ◽  
Laboratory Measurements

Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy

2005 ◽  
pp. 75-81
Author(s):  
W. Scholz ◽  
C. Mihalcea ◽  
S. Werner ◽  
S. Münster ◽  
E. Oesterschulze
Keyword(s):  
Near Field ◽  
Cantilever Sensors
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