In-situ investigation of aerosol particles by atomic force microscopy

1998 ◽  
Vol 361 (6-7) ◽  
pp. 716-721 ◽  
Author(s):  
G. Köllensperger ◽  
G. Friedbacher ◽  
M. Grasserbauer
Keyword(s):  
Atomic Force Microscopy ◽  
Aerosol Particles ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation

In-situ investigation of surface processes on AlGaAs/GaAs cleavage edges as studied by atomic force microscopy

1995 ◽  
Vol 353 (5-8) ◽  
pp. 670-674
Author(s):  
T. Prohaska ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
H. Nickel ◽  
R. L�sch ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Processes ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation

In Situ Investigation of Aluminum Gallium Arsenide/Gallium Arsenide Multilayer Structures under Inert and Reactive Media by Atomic Force Microscopy

1995 ◽  
Vol 67 (9) ◽  
pp. 1530-1535 ◽  
Author(s):  
Thomas. Prohaska ◽  
Gernot. Friedbacher ◽  
Manfred. Grasserbauer ◽  
Heinrich. Nickel ◽  
Rainer. Loesch ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Gallium Arsenide ◽  
Aluminum Gallium Arsenide ◽  
Multilayer Structures ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation ◽  
Reactive Media

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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