Spectroscopic and ion probe characterization of laser produced plasmas used for thin film growth
1991 ◽
pp. 28-37
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Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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Keyword(s):
2012 ◽
Keyword(s):
1994 ◽
Vol 13
(11)
◽
pp. 832-834
◽
Keyword(s):