ESR and X-ray diffraction studies of the CVD diamond films

1997 ◽  
Vol 12 (1) ◽  
pp. 53-59 ◽  
Author(s):  
K. Fabisiak ◽  
F. Rozpłoch
Keyword(s):  
Diamond Films ◽  
Cvd Diamond ◽  
X Ray Diffraction ◽  
X Ray

Local order in CVD diamond films : Comparative Raman, x-ray-diffraction, and x-ray-absorption near-edge studies

1998 ◽  
Vol 57 (22) ◽  
pp. 14123-14132 ◽  
Author(s):  
L. Fayette ◽  
B. Marcus ◽  
M. Mermoux ◽  
G. Tourillon ◽  
K. Laffon ◽  
...  
Keyword(s):  
Diamond Films ◽  
Cvd Diamond ◽  
Local Order ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

Grain Impingement and Intrinsic Stresses in CVD Diamond

1997 ◽  
Vol 505 ◽  
Author(s):  
S. Nijhawan ◽  
J. Rankin ◽  
B. L Walden ◽  
B. W. Sheldon
Keyword(s):  
Tensile Strain ◽  
Diamond Films ◽  
Cvd Diamond ◽  
Intermediate Annealing ◽  
X Ray Diffraction ◽  
Entire Sample ◽  
X Ray ◽  
Pole Figures ◽  
Annealing Step ◽  
Film Microstructure

ABSTRACTIntrinsic stresses in polycrystalline CVD diamond films have been related to restructuring at grain boundaries. It is speculated that reducing the interfacial energy induces an elastic tensile strain. There appears to be a correlation between the evolution of macroscopic stresses in the entire sample and localized, non-homogeneous stresses in the microstructure based on Raman Spectroscopy and x-ray diffraction pole figures. A multistep processing sequence developed previously can help reduce these stresses substantially, by using an intermediate annealing step when the diamond grains are partially coalesced. Our results suggest that small changes in the film microstructure due to annealing can reduce both homogeneous and non-homogeneous stresses.

X-ray diffraction characterization of epitaxial CVD diamond films with natural and isotopically modified compositions

2016 ◽  
Vol 61 (6) ◽  
pp. 979-986 ◽  
Author(s):  
I. A. Prokhorov ◽  
A. E. Voloshin ◽  
V. G. Ralchenko ◽  
A. P. Bolshakov ◽  
D. A. Romanov ◽  
...  
Keyword(s):  
Diamond Films ◽  
Cvd Diamond ◽  
X Ray Diffraction ◽  
X Ray

Stress study of HFCVD boron-doped diamond films by X-ray diffraction measurements

2001 ◽  
Vol 10 (3-7) ◽  
pp. 750-754 ◽  
Author(s):  
N.G. Ferreira ◽  
E. Abramof ◽  
E.J. Corat ◽  
N.F. Leite ◽  
V.J. Trava-Airoldi
Keyword(s):  
Diamond Films ◽  
X Ray Diffraction ◽  
Boron Doped Diamond ◽  
X Ray ◽  
Boron Doped ◽  
Stress Study

Residual stresses in chemical vapor deposition free-standing diamond films by X-ray diffraction analyses

2000 ◽  
Vol 288 (2) ◽  
pp. 217-222 ◽  
Author(s):  
O Durand ◽  
R Bisaro ◽  
C.J Brierley ◽  
P Galtier ◽  
G.R Kennedy ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Residual Stresses ◽  
Vapor Deposition ◽  
Diamond Films ◽  
Chemical Vapor ◽  
X Ray Diffraction ◽  
Free Standing ◽  
X Ray

scholarly journals Selection of CVD Diamond Crystals for X-ray Monochromator Applications Using X-ray Diffraction Imaging

Crystals ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 396 ◽  
Author(s):  
Stanislav Stoupin ◽  
Thomas Krawczyk ◽  
Zunping Liu ◽  
Carl Franck
Keyword(s):  
Spline Interpolation ◽  
Cvd Diamond ◽  
Effective Radius ◽  
Radius Of Curvature ◽  
X Ray Diffraction ◽  
Average Width ◽  
Rocking Curve ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Diffraction Imaging

A set of 20 single crystal diamond plates synthesized using chemical vapor deposition (CVD) was studied using X-ray diffraction imaging to determine their applicability as side-bounce (single-reflection) Laue monochromators for synchrotron radiation. The crystal plates were of optical grade (as provided by the supplier) with (001) nominal surface orientation. High dislocation density was found for all samples. Distortions in the crystal lattice were quantified for low-index Laue reflections of interests using rocking curve topography. Maps of effective radius of curvature in the scattering plane were calculated using spline interpolation of the rocking curve peak position across the studied plates. For several selected plates, nearly flat regions with large effective radius of curvature were found ( R 0 ≳ 30 - 70 m, some regions as large as 1 × 4 mm 2 ). The average width of the rocking curve for these regions was found to be about 150 μ rad (r.m.s.). These observations suggest that the selected CVD diamond plates could be used as intermediate-bandwidth monochromators refocusing the radiation source to a specific location downstream with close to 1:1 distance ratio.

Effects of Seeding Over the Microstructure and Stresses of Diamond Thin Films

1999 ◽  
Vol 594 ◽  
Author(s):  
S. Gupta ◽  
G. Morell ◽  
R. S. Katiyar ◽  
D. R. Gilbert ◽  
R. K. Singh
Keyword(s):  
Electron Cyclotron Resonance ◽  
Raman Band ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Interfacial Stress ◽  
Intrinsic Stress ◽  
Seeding Density ◽  
X Ray Diffraction ◽  
Total Stress ◽  
X Ray

AbstractWe have studied diamond films grown by electron cyclotron resonance-assisted chemical vapor deposition (ECR-CVD) at low pressure (1.0 Torr) and temperatures (550–700 °C). These films were grown on seeded Si (111) substrates with different diamond seed densities (0.225, 1.5, 2.3, and 3.1 × 109 nuclei/cm2). Scanning electron microscopy (SEM), X-ray diffraction (XRD) and Raman spectroscopy (RS) were employed to investigate the crystalline quality, diamond yield, and stresses developed in the films as a function of seeding density. Thermal interfacial stress, interactions across grain boundaries, and internal stress were considered in order to account for the total stress observed from the Raman band. We present correlations among seed density, relative amount of non-sp3 phase, O/C ratio, and total intrinsic stress.

Properties of Li-Doped ZnO Films Deposited on Diamond Films

2013 ◽  
Vol 544 ◽  
pp. 234-237
Author(s):  
Mei Ai Lin ◽  
Lin Jun Wang ◽  
Jian Huang ◽  
Ke Tang ◽  
Bing Ren ◽  
...  
Keyword(s):  
Diamond Films ◽  
Hall Effect Measurement ◽  
Zno Films ◽  
Radio Frequency Magnetron Sputtering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Doped Zno ◽  
Effect Of Oxygen ◽  
Reactive Gas

Li-doped zinc oxide (ZnO) films were deposited on nucleation side of freestanding diamond (FSD) films by the radio frequency magnetron sputtering method. The effect of oxygen partial pressure on structural, optical and electrical properties of the ZnO films was investigated by X-ray diffraction (XRD) Raman spectroscopy, semiconductor characterization system and Hall effect measurement system. The results showed that the introduction of oxygen as a reactive gas was helpful to improve the crystalline quality of Li-doped ZnO films.

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