Electrical and structural characterization of GaAs vertical-sidewall epilayers grown by atomic layer epitaxy

1992 ◽  
Vol 21 (1) ◽  
pp. 109-114 ◽  
Author(s):  
D. B. Gladden ◽  
W. D. Goodhue ◽  
C. A. Wang ◽  
G. A. Lincoln
1994 ◽  
Vol 75 (5) ◽  
pp. 2398-2405 ◽  
Author(s):  
C. A. Tran ◽  
R. A. Masut ◽  
J. L. Brebner ◽  
M. Jouanne

RSC Advances ◽  
2017 ◽  
Vol 7 (13) ◽  
pp. 8051-8059 ◽  
Author(s):  
Michael N. Getz ◽  
Per-Anders Hansen ◽  
Helmer Fjellvåg ◽  
Ola Nilsen

Optical and structural characterization of luminescent thin films of the novel material europium titanium phosphate, deposited by atomic layer deposition.


1994 ◽  
Vol 145 (1-4) ◽  
pp. 332-337 ◽  
Author(s):  
C.A. Tran ◽  
R.A. Masut ◽  
J.L. Brebner ◽  
M. Jouanne ◽  
L. Salamanca-Riba ◽  
...  

2015 ◽  
Vol 589 ◽  
pp. 47-51 ◽  
Author(s):  
Neeraj Nepal ◽  
Virginia R. Anderson ◽  
Jennifer K. Hite ◽  
Charles R. Eddy

Sign in / Sign up

Export Citation Format

Share Document